Fangzhou Mu, Sicheng Mo, Jiayong Peng, Xiaochun Liu, J. Nam, S. Raghavan, A. Velten, Yin Li
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引用次数: 7
Abstract
Computational approach to imaging around the corner, or non-line-of-sight (NLOS) imaging, is becoming a reality thanks to major advances in imaging hardware and reconstruction algorithms. A recent development towards practical NLOS imaging, Nam et al. [1] demonstrated a high-speed non-confocal imaging system that operates at 5 Hz, 100x faster than the prior art. This enormous gain in acquisition rate, however, necessitates numerous approximations in light transport, breaking many existing NLOS reconstruction methods that assume an idealized image formation model. To bridge the gap, we present a novel deep model that incorporates the complementary physics priors of wave propagation and volume rendering into a neural network for high-quality and robust NLOS reconstruction. This orchestrated design regularizes the solution space by relaxing the image formation model, resulting in a deep model that generalizes well on real captures despite being exclusively trained on synthetic data. Further, we devise a unified learning framework that enables our model to be flexibly trained using diverse supervision signals, including target intensity images or even raw NLOS transient measurements. Once trained, our model renders both intensity and depth images at inference time in a single forward pass, capable of processing more than 5 captures per second on a high-end GPU. Through extensive qualitative and quantitative experiments, we show that our method outperforms prior physics and learning based approaches on both synthetic and real measurements. We anticipate that our method along with the fast capturing system will accelerate future development of NLOS imaging for real world applications that require high-speed imaging.
期刊介绍:
The IEEE Transactions on Pattern Analysis and Machine Intelligence publishes articles on all traditional areas of computer vision and image understanding, all traditional areas of pattern analysis and recognition, and selected areas of machine intelligence, with a particular emphasis on machine learning for pattern analysis. Areas such as techniques for visual search, document and handwriting analysis, medical image analysis, video and image sequence analysis, content-based retrieval of image and video, face and gesture recognition and relevant specialized hardware and/or software architectures are also covered.