{"title":"Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration","authors":"Soyed Tuhin Ahmed, M. Tahoori","doi":"10.1109/MDAT.2023.3270126","DOIUrl":null,"url":null,"abstract":"This article focuses on recalibration of neural networks implemented in neuromorphic in-memory computing with memristors. The primary goal of the article is to reduce the amount of data required for recalibration which makes it particularly useful in scenarios where data availability is limited or where recalibration overhead is a concern. Moreover, the proposed approach is robust against both process and temperature variations at a significantly lower overhead compared to related works. This practical method addresses an important issue that can affect the accuracy of neural networks implemented using emerging resistive nonvolatile memories.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"40 1","pages":"42-50"},"PeriodicalIF":1.9000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MDAT.2023.3270126","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
This article focuses on recalibration of neural networks implemented in neuromorphic in-memory computing with memristors. The primary goal of the article is to reduce the amount of data required for recalibration which makes it particularly useful in scenarios where data availability is limited or where recalibration overhead is a concern. Moreover, the proposed approach is robust against both process and temperature variations at a significantly lower overhead compared to related works. This practical method addresses an important issue that can affect the accuracy of neural networks implemented using emerging resistive nonvolatile memories.
期刊介绍:
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.