Magneto-optical properties of wider gap semiconductors ZnMnTe and ZnMnSe films prepared by MBE

Masaaki Imamura , Daisuke Tashima , Jiro Kitagawa , Hironori Asada
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引用次数: 3

Abstract

The II-VI based magnetic semiconductors with a direct and wide optical bandgap are expected to show high potential for optical applications utilizing short wavelength laser diodes (LDs), such as 532-nm green and 475-nm blue LDs. We have confirmed that the Faraday rotation θF in the ZnMnTe and ZnMnSe films deposited on quartz glass (QG) and sapphire (SA) substrates by using molecular beam epitaxy (MBE) is large near the absorption edge. This paper reports the magneto-optical properties of ZnMnTe and ZnMnSe films synthesized on the QG and SA substrates, and shows the result of a direct Faraday rotation observation successfully made for the ZnMnTe films under 1.28-kHz alternating magnetic fields. The optical absorption characteristics of the ZnMnTe films grown on the SA substrates by MBE are discussed by comparing them with the optical absorption properties and photoluminescence spectra of the II-VI ZnTe parent single crystals.

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MBE制备宽间隙半导体ZnMnTe和ZnMnSe薄膜的磁光特性
基于II-VI的磁性半导体具有直接和宽的光学带隙,有望在利用短波长的激光二极管(ld)的光学应用中显示出很高的潜力,例如532纳米的绿色和475纳米的蓝色ld。在石英玻璃(QG)和蓝宝石(SA)衬底上采用分子束外延(MBE)沉积的ZnMnTe和ZnMnSe薄膜中,法拉第旋转θF在吸收边缘附近较大。本文报道了在QG和SA衬底上合成的ZnMnTe和ZnMnSe薄膜的磁光性质,并展示了在1.28 khz交变磁场下成功地对ZnMnTe薄膜进行直接法拉第旋转观察的结果。通过与II-VI型ZnTe母体单晶的光吸收特性和光致发光光谱的比较,讨论了MBE法生长在SA衬底上的ZnMnTe薄膜的光吸收特性。
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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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