Optimised temperature fluctuation control strategy for lifetime improvement in aircraft electrical power distribution system

IF 1.9 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IET Electrical Systems in Transportation Pub Date : 2022-11-15 DOI:10.1049/els2.12058
Hao Yan, Bangli Du, Abraham Marquez, Giampaolo Buticchi
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引用次数: 1

Abstract

As a power electronic converter with bidirectional energy transmission, the Dual Active Bridge (DAB) has a broad application prospect in the electrical power distribution system of hybrid-electric flight. For the DAB application in the electrical power distribution system, high efficiency and high reliability are envisaged due to the mission-critical nature of the application. A new pulse width modulation optimization control strategy is proposed, which is based on the feedback temperature fluctuations of the GaN (Gallium Nitride) power transistors, to improve the lifetime of the whole circuit. The complete topology and simulations of the DAB converter are carried out in PLECS. Detailed simulation results manifest the precise lifetime of the GaN power transistors and verify the accuracy of the new optimization control strategy. Meanwhile, Insulated Gate Bipolar Translator is set as a control group to compare the lifetime of conventional silicon-based power devices with the GaN power transistor. Hardware In Loop platform test is built to further validate the proposed method.

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提高飞机配电系统寿命的温度波动优化控制策略
双有源电桥(DAB)作为一种双向能量传输的电力电子变换器,在混合动力飞行配电系统中具有广阔的应用前景。对于DAB在配电系统中的应用,由于其应用的关键任务性质,设想了高效率和高可靠性。为了提高整个电路的使用寿命,提出了一种基于氮化镓功率晶体管反馈温度波动的脉宽调制优化控制策略。在PLECS中完成了DAB变换器的完整拓扑结构和仿真。详细的仿真结果显示了GaN功率晶体管的精确寿命,并验证了新优化控制策略的准确性。同时,设置绝缘栅双极转换器作为对照组,比较传统硅基功率器件与GaN功率晶体管的寿命。硬件在环平台测试进一步验证了所提出的方法。
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来源期刊
CiteScore
5.80
自引率
4.30%
发文量
18
审稿时长
29 weeks
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