{"title":"Microscale Mapping of Structure and Stress in Barium Titanate","authors":"J. A. Howell, M. Vaudin, L. Friedman, R. Cook","doi":"10.6028/jres.125.013","DOIUrl":null,"url":null,"abstract":"Cross-correlation of electron backscatter diffraction (EBSD) patterns was used to generate rotation, strain, and stress maps of single-crystal tetragonal barium titanate (BaTiO3) containing isolated, small, sub-micrometer a domains separated from a c-domain matrix by 90° domain boundaries. Spatial resolution of about 30 nm was demonstrated over 5 μm maps, with rotation and strain resolutions of approximately 10−4. The magnitudes of surface strains and, especially, rotations peaked within and adjacent to isolated domains at values of approximately 10−2, i.e., the tetragonal distortion of BaTiO3. The conjugate stresses between a domains peaked at about 1 GPa, and principal stress analysis suggested that stable microcrack formation in the c domain was possible. The results clearly demonstrate the applicability of EBSD to advanced multilayer ceramic capacitor reliability and strongly support the coupling between the electrical performance and underlying mechanical state of BaTiO3-containing devices.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":" ","pages":""},"PeriodicalIF":1.3000,"publicationDate":"2020-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.125.013","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Institute of Standards and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.6028/jres.125.013","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Cross-correlation of electron backscatter diffraction (EBSD) patterns was used to generate rotation, strain, and stress maps of single-crystal tetragonal barium titanate (BaTiO3) containing isolated, small, sub-micrometer a domains separated from a c-domain matrix by 90° domain boundaries. Spatial resolution of about 30 nm was demonstrated over 5 μm maps, with rotation and strain resolutions of approximately 10−4. The magnitudes of surface strains and, especially, rotations peaked within and adjacent to isolated domains at values of approximately 10−2, i.e., the tetragonal distortion of BaTiO3. The conjugate stresses between a domains peaked at about 1 GPa, and principal stress analysis suggested that stable microcrack formation in the c domain was possible. The results clearly demonstrate the applicability of EBSD to advanced multilayer ceramic capacitor reliability and strongly support the coupling between the electrical performance and underlying mechanical state of BaTiO3-containing devices.
期刊介绍:
The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards.
In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research.
The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.