Microscale Mapping of Structure and Stress in Barium Titanate

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION Journal of Research of the National Institute of Standards and Technology Pub Date : 2020-04-04 DOI:10.6028/jres.125.013
J. A. Howell, M. Vaudin, L. Friedman, R. Cook
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Abstract

Cross-correlation of electron backscatter diffraction (EBSD) patterns was used to generate rotation, strain, and stress maps of single-crystal tetragonal barium titanate (BaTiO3) containing isolated, small, sub-micrometer a domains separated from a c-domain matrix by 90° domain boundaries. Spatial resolution of about 30 nm was demonstrated over 5 μm maps, with rotation and strain resolutions of approximately 10−4. The magnitudes of surface strains and, especially, rotations peaked within and adjacent to isolated domains at values of approximately 10−2, i.e., the tetragonal distortion of BaTiO3. The conjugate stresses between a domains peaked at about 1 GPa, and principal stress analysis suggested that stable microcrack formation in the c domain was possible. The results clearly demonstrate the applicability of EBSD to advanced multilayer ceramic capacitor reliability and strongly support the coupling between the electrical performance and underlying mechanical state of BaTiO3-containing devices.
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钛酸钡结构和应力的微尺度制图
电子背散射衍射(EBSD)互相关图用于生成单晶四方钛酸钡(BaTiO3)的旋转、应变和应力图,该单晶四方钛酸钡(BaTiO3)含有孤立的、小的、亚微米的a畴,与c畴矩阵以90°畴边界分隔。5 μm图的空间分辨率约为30 nm,旋转和应变分辨率约为10−4。表面应变的大小,尤其是旋转的大小在孤立畴内和邻近区域达到峰值,约为10−2,即BaTiO3的四方畸变。a域之间的共轭应力峰值约为1 GPa,主应力分析表明c域可能形成稳定的微裂纹。结果清楚地证明了EBSD对先进多层陶瓷电容器可靠性的适用性,并有力地支持了含batio3器件的电性能与底层力学状态之间的耦合。
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来源期刊
自引率
33.30%
发文量
10
审稿时长
>12 weeks
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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