{"title":"Failure Mode & Effect Analysis and another Methodology for Improving Data Veracity and Validity","authors":"Ana Elsa Hinojosa Herrera, C. Walshaw, C. Bailey","doi":"10.33166/aetic.2020.03.002","DOIUrl":null,"url":null,"abstract":"Failure Mode & Effect Analysis (FMEA) is a method that has been used to improve reliability of products, processes, designs, and software for different applications. In this paper we extend its usage for data veracity and validity improvement in the context of big data analysis and discuss its application in an electronics manufacturing test procedure which consists of a sequence of tests. Finally, we describe another methodology, developed as a result of the DVV-FMEA application which is aimed at improving the tests' repeatability and failure detection capabilities as well as monitoring their reliability.","PeriodicalId":36440,"journal":{"name":"Annals of Emerging Technologies in Computing","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annals of Emerging Technologies in Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.33166/aetic.2020.03.002","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Computer Science","Score":null,"Total":0}
引用次数: 2
Abstract
Failure Mode & Effect Analysis (FMEA) is a method that has been used to improve reliability of products, processes, designs, and software for different applications. In this paper we extend its usage for data veracity and validity improvement in the context of big data analysis and discuss its application in an electronics manufacturing test procedure which consists of a sequence of tests. Finally, we describe another methodology, developed as a result of the DVV-FMEA application which is aimed at improving the tests' repeatability and failure detection capabilities as well as monitoring their reliability.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
