Regulating dielectric performances of Poly(vinylidene fluoride) nanocomposites by individually controlling shell thickness of Core@Double-Shells structured nanowires

IF 3.8 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IET Nanodielectrics Pub Date : 2021-02-21 DOI:10.1049/nde2.12003
Minhao Yang, Zhi-Yong Xue, Zhi-Min Dang, Yang Shen, Paul Haghi-Ashtiani, Delong He, Jian Xu, Jinbo Bai
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引用次数: 4

Abstract

The synthesis of core@double-shells structured TiO2@C@SiO2 nanowires (NWs) with variable thickness of carbon inner shell and SiO2 outer shell was achieved by individually controlling the chemical vapour deposition time and amount of silicon precursor added in the sol–gel synthesis. The resultant TiO2@C@SiO2 NWs filled nanocomposites exhibited an excellent dielectric performance with simultaneously improved dielectric constant and suppressed dielectric loss, which could be further regulated by individually controlling the carbon inner shell and SiO2 outer shell thickness. More importantly, the influences of the conductive carbon inner shell and insulated SiO2 outer shell thickness on the dielectric performance of nanocomposites were clearly revealed. The increase of the conductive carbon inner shell thickness would lead to an increase in dielectric constant and loss of nanocomposites, while the insulated SiO2 outer shell exhibited a totally opposite law that the dielectric constant and loss of nanocomposites decrease with increasing SiO2 outer shell thickness. Numerical simulations were also carried out to theoretically verify the relationship between the dielectric loss and SiO2 outer shell thickness. This promising controllable multi-shell structure could be extended to a variety of hybrids to develop high-performance dielectric nanocomposites.

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通过单独控制Core@Double - Shells结构纳米线的壳厚度来调节聚偏氟乙烯纳米复合材料的介电性能
通过控制化学气相沉积时间和溶胶-凝胶合成过程中硅前驱体的添加量,合成了具有变厚度碳壳和变厚度sio2外壳的core@double‐壳结构tio2 @C@SiO 2纳米线(NWs)。由此制备的tio2 @C@SiO 2 NWs填充纳米复合材料具有优异的介电性能,同时提高了介电常数和抑制了介电损耗,这可以通过单独控制碳内壳和sio2外层厚度来进一步调节。更重要的是,揭示了导电碳内壳和绝缘二氧化硅外壳厚度对纳米复合材料介电性能的影响。增加导电碳的内壳厚度会导致纳米复合材料的介电常数和损耗增加,而绝缘的二氧化硅外壳则表现出完全相反的规律,随着二氧化硅外壳厚度的增加,纳米复合材料的介电常数和损耗减小。通过数值模拟从理论上验证了介质损耗与sio2外壳厚度之间的关系。这种有前途的可控多壳结构可以扩展到各种杂化材料中,以开发高性能的介电纳米复合材料。
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来源期刊
IET Nanodielectrics
IET Nanodielectrics Materials Science-Materials Chemistry
CiteScore
5.60
自引率
3.70%
发文量
7
审稿时长
21 weeks
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