{"title":"Scatter Corrections in X-Ray Computed Tomography: A Physics-Based Analysis.","authors":"Z. Levine, Timothy Blattner, A. Peskin, A. Pintar","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.013","DOIUrl":null,"url":null,"abstract":"Fundamental limits for the calculation of scattering corrections within X-ray computed tomography (CT) are found within the independent atom approximation from an analysis of the cross sections, CT geometry, and the Nyquist sampling theorem, suggesting large reductions in computational time compared to existing methods. By modifying the scatter by less than 1 %, it is possible to treat some of the elastic scattering in the forward direction as inelastic to achieve a smoother elastic scattering distribution. We present an analysis showing that the number of samples required for the smoother distribution can be greatly reduced. We show that fixed forced detection can be used with many fewer points for inelastic scattering, but that for pure elastic scattering, a standard Monte Carlo calculation is preferred. We use smoothing for both elastic and inelastic scattering because the intrinsic angular resolution is much poorer than can be achieved for projective tomography. Representative numerical examples are given.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 1","pages":"1-23"},"PeriodicalIF":1.3000,"publicationDate":"2019-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Institute of Standards and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.013","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 10
Abstract
Fundamental limits for the calculation of scattering corrections within X-ray computed tomography (CT) are found within the independent atom approximation from an analysis of the cross sections, CT geometry, and the Nyquist sampling theorem, suggesting large reductions in computational time compared to existing methods. By modifying the scatter by less than 1 %, it is possible to treat some of the elastic scattering in the forward direction as inelastic to achieve a smoother elastic scattering distribution. We present an analysis showing that the number of samples required for the smoother distribution can be greatly reduced. We show that fixed forced detection can be used with many fewer points for inelastic scattering, but that for pure elastic scattering, a standard Monte Carlo calculation is preferred. We use smoothing for both elastic and inelastic scattering because the intrinsic angular resolution is much poorer than can be achieved for projective tomography. Representative numerical examples are given.
期刊介绍:
The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards.
In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research.
The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.