Numerical Investigation of Diffraction Patterns of Small Size Apertures Using Light Sources From Xuv to The Visible Region: Simulation for The Small Size Structures

M. Sayrac, E. Kaynar, F. Ungan
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Abstract

In the present work, a computer simulation program generates Fresnel diffraction patterns from small-size apertures using illumination wavelengths from extreme ultraviolet (XUV) to the visible region suggesting that it can be used to model a wide range of experimental setups. By being able to simulate diffraction patterns for such a broad range of wavelengths, the program can be used to investigate the effects of varying wavelengths and aperture size on the resulting pattern. By using a computer simulation program that can generate Fresnel diffraction patterns across a wide range of wavelengths, one can explore how different wavelengths of light interact with various aperture sizes. This allows one to investigate the effects of changing these parameters on the resulting diffraction pattern. The computer simulation program generating Fresnel diffraction patterns from square apertures by using the illumination wavelength sources from XUV to the visible region has been studied. Changing the aperture-screen distance, the illumination wavelength, and the aperture size provides a clear transition of diffraction patterns from the Fresnel to the Fraunhofer region. The diffraction patterns obtained by the Fresnel integral method have been compared with that simulated by the Fraunhofer calculation. There is a good agreement between the results. The structural similarity index (SSI) exhibits that comparing the diffraction images produced with both approaches agree.
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光源从可见光区到可见光区的小孔径衍射图样的数值研究:小尺寸结构的模拟
在目前的工作中,一个计算机模拟程序使用从极紫外(XUV)到可见光区域的照明波长从小尺寸孔径生成菲涅耳衍射图案,这表明它可以用于对各种实验装置进行建模。通过能够模拟如此宽波长范围的衍射图案,该程序可以用于研究不同波长和孔径大小对最终图案的影响。通过使用可以在宽波长范围内生成菲涅耳衍射图案的计算机模拟程序,可以探索不同波长的光如何与各种孔径大小相互作用。这允许研究改变这些参数对所得衍射图案的影响。研究了利用XUV到可见光区域的光照波长源由正方形孔径产生菲涅耳衍射图样的计算机模拟程序。改变孔径-屏幕距离、照明波长和孔径大小提供了衍射图案从菲涅耳到夫琅和费区域的清晰过渡。将菲涅耳积分法得到的衍射图与夫琅和费计算模拟的衍射图进行了比较。结果之间有很好的一致性。结构相似性指数(SSI)表明,将两种方法产生的衍射图像进行比较是一致的。
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51
审稿时长
10 weeks
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