Forecasting the yield of wafer by using improved genetic algorithm, high dimensional alternating feature selection and SVM with uneven distribution and high-dimensional data
{"title":"Forecasting the yield of wafer by using improved genetic algorithm, high dimensional alternating feature selection and SVM with uneven distribution and high-dimensional data","authors":"Qiuhao Xu, Chuqiao Xu, Junliang Wang","doi":"10.1007/s43684-022-00041-3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":71187,"journal":{"name":"自主智能系统(英文)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"自主智能系统(英文)","FirstCategoryId":"1093","ListUrlMain":"https://doi.org/10.1007/s43684-022-00041-3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}