AN IMPROVED METHOD OF BUSBAR VOLTAGE RECONSTRUCTION FROM SIGNALS OF ELECTRIC FIELD SENSORS INSTALLED IN AN INDOOR MV SUBSTATION

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Metrology and Measurement Systems Pub Date : 2023-07-20 DOI:10.24425/118155
D. Borkowski
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引用次数: 1

Abstract

This paper presents an improved method for the reconstruction of busbar voltage waveforms from signals acquired by a system of electric field (EF) sensors located in an indoor medium voltage substation. In the previous work [8], the authors proposed the use of black-box models in the form of artificial neural networks (ANNs) for this task. In this paper it is shown that a parametric model of the system of EF sensors can reconstruct voltages with much lower errors, provided that it is accurately identified. The model identification is done by minimization of a nonlinear goal function, i.e. mean squared error (MSE) of voltage reconstruction. As a result of examining several optimization techniques, the method based on simulated annealing extended with a simplex search, is proposed. The performance of the model identified with this method is at least 8 times better in terms of MSE and at least 12 times better in terms of frequency domain errors than the best one of concurrent ANNs.
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一种改进的由室内MV变电站电场传感器信号重构母线电压的方法
本文提出了一种利用室内中压变电所电场传感器采集的信号重建母线电压波形的改进方法。在之前的工作[8]中,作者提出使用人工神经网络(ann)形式的黑盒模型来完成这项任务。本文表明,在准确识别的前提下,EF传感器系统的参数化模型可以以更小的误差重建电压。模型识别是通过最小化一个非线性目标函数,即电压重构的均方误差(MSE)来完成的。在分析了几种优化方法的基础上,提出了一种基于单纯形搜索的模拟退火优化方法。与最佳的并行神经网络相比,该方法识别的模型在MSE方面至少提高了8倍,在频域误差方面至少提高了12倍。
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来源期刊
Metrology and Measurement Systems
Metrology and Measurement Systems INSTRUMENTS & INSTRUMENTATION-
CiteScore
2.00
自引率
10.00%
发文量
0
审稿时长
6 months
期刊介绍: Contributions are invited on all aspects of the research, development and applications of the measurement science and technology. The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments. The average publication cycle is 6 months.
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