{"title":"The effect of magnetic quadrupole lens hysteresis on the focusing of an ion beam with variable energy in a nuclear scanning microprobe","authors":"A. V. Romanenko, A. G. Ponomarev","doi":"10.1134/S1063785013040123","DOIUrl":null,"url":null,"abstract":"<p>The influence of the hysteresis of magnetic quadrupole lenses on the transverse size of a beam focused on the target in a probe-forming system with a separated Russian quadruplet configuration has been experimentally studied. The measurements were performed in a nuclear scanning microprobe using a proton beam with the ion energy varied within 0.8–1.6 MeV. The beam size was determined by processing the secondary electron emission profiles measured during scanning of a calibrated micrometric square mesh. A new approach is proposed that allows a beam with variable energy in the nuclear microprobe to be focused so as to keep the probe size within preset limits.</p>","PeriodicalId":784,"journal":{"name":"Technical Physics Letters","volume":"39 4","pages":"317 - 320"},"PeriodicalIF":0.8000,"publicationDate":"2013-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1134/S1063785013040123","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Physics Letters","FirstCategoryId":"101","ListUrlMain":"https://link.springer.com/article/10.1134/S1063785013040123","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 1
Abstract
The influence of the hysteresis of magnetic quadrupole lenses on the transverse size of a beam focused on the target in a probe-forming system with a separated Russian quadruplet configuration has been experimentally studied. The measurements were performed in a nuclear scanning microprobe using a proton beam with the ion energy varied within 0.8–1.6 MeV. The beam size was determined by processing the secondary electron emission profiles measured during scanning of a calibrated micrometric square mesh. A new approach is proposed that allows a beam with variable energy in the nuclear microprobe to be focused so as to keep the probe size within preset limits.
期刊介绍:
Technical Physics Letters is a companion journal to Technical Physics and offers rapid publication of developments in theoretical and experimental physics with potential technological applications. Recent emphasis has included many papers on gas lasers and on lasing in semiconductors, as well as many reports on high Tc superconductivity. The excellent coverage of plasma physics seen in the parent journal, Technical Physics, is also present here with quick communication of developments in theoretical and experimental work in all fields with probable technical applications. Topics covered are basic and applied physics; plasma physics; solid state physics; physical electronics; accelerators; microwave electron devices; holography.