Co-occurrence histogram based ensemble of classifiers for classification of cervical cancer cells

Rajesh Yakkundimath , Varsha Jadhav , Basavaraj Anami , Naveen Malvade
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引用次数: 3

Abstract

To explore the potential of conventional image processing techniques in the classification of cervical cancer cells, in this work, a co-occurrence histogram method was employed for image feature extraction and an ensemble classifier was developed by combining the base classifiers, namely, the artificial neural network (ANN), random forest (RF), and support vector machine (SVM), for image classification. The segmented pap-smear cell image dataset was constructed by the k-means clustering technique and used to evaluate the performance of the ensemble classifier which was formed by the combination of the above considered base classifiers. The result was also compared with that achieved by the individual base classifiers as well as that trained with color, texture, and shape features. The maximum average classification accuracy of 93.44% was obtained when the ensemble classifier was applied and trained with co-occurrence histogram features, which indicates that the ensemble classifier trained with the co-occurrence histogram features is more suitable for the classification of cervical cancer cells.

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基于共现直方图的子宫颈癌症细胞分类分类器集成
为了探索传统图像处理技术在宫颈癌细胞分类中的潜力,本研究采用共现直方图方法进行图像特征提取,并将人工神经网络(ANN)、随机森林(RF)和支持向量机(SVM)等基础分类器相结合,开发了一种集成分类器进行图像分类。采用k-means聚类技术构建分割后的pap-smear细胞图像数据集,并利用该数据集评价由上述基分类器组合而成的集成分类器的性能。结果还与单个基本分类器以及使用颜色、纹理和形状特征训练的分类器所获得的结果进行了比较。采用共现直方图特征训练的集成分类器的最大平均分类准确率为93.44%,说明用共现直方图特征训练的集成分类器更适合于宫颈癌细胞的分类。
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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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