Study of thin Films of Nickel Oxide (NiO) Deposited by the Spray Pyrolysis Method

A. Bouhank, Y. Bellal, H. Serrar
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引用次数: 1

Abstract

Antar Bouhank, Youcef. Bellal and Hacene Serrar 1. Research Center in Industrial Technologies (CRTI) P.O. Box 64Cheraga, Algiers 16014, Algeria 2. Laboratory of Chemical Process Engineering (LCPE), Faculty of technology, Ferhat ABBAS Setif-1 University, Setif 19000 Algeria Abstract: In this work, thin films of nickel oxide (NiO) were deposited by a simple and inexpensive technique, which is spray pyrolysis on ordinary glass substrates heated to a fixed temperature of 500 °C, from a solution containing nickel nitrate hexahydrate as a precursor dissolved in distilled water with deferent values of concentrations. The NiO thin films obtained were characterized to determine the structure with X-ray diffraction technique (XRD), the absorption domain (UV-Visible Spectroscopy), and the surface morphology (SEM). The X-ray diffraction patterns confirm the presence of NiO phase with preferential orientation along the (111) direction. The optical gap for nickel oxide calculated with a concentration of 0.1 M from the measurement of optical absorption is 3.6 eV, which is quite comparable to the value of the ratio.
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喷雾热解法沉积氧化镍薄膜的研究
Antar Bouhank,Youcef。Bellal和Hacene Serrar 1。阿尔及利亚阿尔及尔工业技术研究中心(CRTI)邮政信箱64Cheraga 16014 2。化学工艺工程实验室(LCPE),技术学院,Ferhat ABBAS Setif-1大学,Setif 19000阿尔及利亚摘要:在这项工作中,通过一种简单而廉价的技术沉积了氧化镍(NiO)薄膜,该技术是在加热到500°C的固定温度的普通玻璃基板上进行喷雾热解,从含有硝酸镍六水合物作为前体的溶液中以不同浓度值溶解在蒸馏水中。利用X射线衍射技术(XRD)、吸收域(UV-可见光谱)和表面形貌(SEM)对所获得的NiO薄膜进行了表征,以确定其结构。X射线衍射图证实了沿(111)方向具有优先取向的NiO相的存在。根据光学吸收的测量,以0.1M的浓度计算的氧化镍的光学间隙为3.6eV,这与该比率的值相当。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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