Point-plane distance as model for uncertainty evaluation of coordinate measurement

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Metrology and Measurement Systems Pub Date : 2023-07-20 DOI:10.24425/mms.2020.134843
Wojciech Płowucha
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引用次数: 8

Abstract

The paper presents a detailed theoretical background for coordinate measurement uncertainty evaluation by means of Type B evaluation method, taking into account information on accuracy of a coordinate measuring system given with the formula for maximum permissible errors of length measurement and verification test results. A proposal for evaluation of the verification test results is made. A measurement model based on the point-plane distance equation is presented. A detailed analysis of the partial derivatives (sensitivity factors in an uncertainty budget) of the measurement model is presented. The analyses of measurement uncertainty for different geometrical characteristics were conducted using this measurement model. Examples of uncertainty evaluation for geometrical deviations are presented: position of a point related to a datum plane and flatness in the case of convex or concave surfaces. The examples include detailed uncertainty budgets.
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点平面距离作为坐标测量不确定度评定模型
本文介绍了采用B型评定方法进行坐标测量不确定度评定的详细理论背景,同时考虑了坐标测量系统的精度信息以及长度测量的最大允许误差公式和验证试验结果。提出了对验证测试结果进行评估的建议。提出了一种基于点平面距离方程的测量模型。对测量模型的偏导数(不确定性预算中的敏感因素)进行了详细分析。使用该测量模型对不同几何特性的测量不确定度进行了分析。给出了几何偏差的不确定度评估示例:与基准面相关的点的位置以及凸面或凹面情况下的弯曲度。示例包括详细的不确定性预算。
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来源期刊
Metrology and Measurement Systems
Metrology and Measurement Systems INSTRUMENTS & INSTRUMENTATION-
CiteScore
2.00
自引率
10.00%
发文量
0
审稿时长
6 months
期刊介绍: Contributions are invited on all aspects of the research, development and applications of the measurement science and technology. The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments. The average publication cycle is 6 months.
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