Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images

Q3 Immunology and Microbiology Applied Microscopy Pub Date : 2020-10-20 DOI:10.1186/s42649-020-00041-8
Feng Wang, Trond R. Henninen, Debora Keller, Rolf Erni
{"title":"Noise2Atom: unsupervised denoising for scanning transmission electron microscopy images","authors":"Feng Wang,&nbsp;Trond R. Henninen,&nbsp;Debora Keller,&nbsp;Rolf Erni","doi":"10.1186/s42649-020-00041-8","DOIUrl":null,"url":null,"abstract":"<p>We propose an effective deep learning model to denoise scanning transmission electron microscopy (STEM) image series, named Noise2Atom, to map images from a source domain <span>\\(\\mathcal {S}\\)</span> to a target domain <span>\\(\\mathcal {C}\\)</span>, where <span>\\(\\mathcal {S}\\)</span> is for our noisy experimental dataset, and <span>\\(\\mathcal {C}\\)</span> is for the desired clear atomic images. Noise2Atom uses two external networks to apply additional constraints from the domain knowledge. This model requires no signal prior, no noise model estimation, and no paired training images. The only assumption is that the inputs are acquired with identical experimental configurations. To evaluate the restoration performance of our model, as it is impossible to obtain ground truth for our experimental dataset, we propose consecutive structural similarity (CSS) for image quality assessment, based on the fact that the structures remain much the same as the previous frame(s) within small scan intervals. We demonstrate the superiority of our model by providing evaluation in terms of CSS and visual quality on different experimental datasets.</p>","PeriodicalId":470,"journal":{"name":"Applied Microscopy","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2020-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s42649-020-00041-8","citationCount":"28","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1186/s42649-020-00041-8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Immunology and Microbiology","Score":null,"Total":0}
引用次数: 28

Abstract

We propose an effective deep learning model to denoise scanning transmission electron microscopy (STEM) image series, named Noise2Atom, to map images from a source domain \(\mathcal {S}\) to a target domain \(\mathcal {C}\), where \(\mathcal {S}\) is for our noisy experimental dataset, and \(\mathcal {C}\) is for the desired clear atomic images. Noise2Atom uses two external networks to apply additional constraints from the domain knowledge. This model requires no signal prior, no noise model estimation, and no paired training images. The only assumption is that the inputs are acquired with identical experimental configurations. To evaluate the restoration performance of our model, as it is impossible to obtain ground truth for our experimental dataset, we propose consecutive structural similarity (CSS) for image quality assessment, based on the fact that the structures remain much the same as the previous frame(s) within small scan intervals. We demonstrate the superiority of our model by providing evaluation in terms of CSS and visual quality on different experimental datasets.

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Noise2Atom:扫描透射电子显微镜图像的无监督去噪
我们提出了一个有效的深度学习模型来对扫描透射电子显微镜(STEM)图像序列进行降噪,名为Noise2Atom,将图像从源域\(\mathcal {S}\)映射到目标域\(\mathcal {C}\),其中\(\mathcal {S}\)用于我们的噪声实验数据集,\(\mathcal {C}\)用于所需的清晰原子图像。Noise2Atom使用两个外部网络来应用来自领域知识的附加约束。该模型不需要信号先验,不需要噪声模型估计,不需要成对训练图像。唯一的假设是输入是用相同的实验配置获得的。为了评估我们的模型的恢复性能,因为我们的实验数据集不可能获得地面真实值,我们提出了连续结构相似性(CSS)用于图像质量评估,基于这样一个事实,即结构在很小的扫描间隔内与前一帧保持大致相同。我们通过在不同的实验数据集上提供CSS和视觉质量方面的评估来证明我们模型的优越性。
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来源期刊
Applied Microscopy
Applied Microscopy Immunology and Microbiology-Applied Microbiology and Biotechnology
CiteScore
3.40
自引率
0.00%
发文量
10
审稿时长
10 weeks
期刊介绍: Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.
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