Dual-mode terahertz extended interaction oscillator driven by a pseudospark-sourced sheet electron beam

Q1 Engineering Journal of Electronic Science and Technology Pub Date : 2021-09-01 DOI:10.1016/j.jnlest.2021.100093

Jie Xie , Xue-Song Yuan , Liang Zhang , Adrian W. Cross , Hua-Bi Yin , Qing-Yun Chen , Tong-Bin Yang , Xiao-Tao Xu , Yang Yan , Lin Meng

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Abstract

A terahertz dual-mode extended interaction oscillator (EIO) driven by a pseudospark-sourced sheet electron beam (SEB) was presented. The major advantages of the newly developed circuit include 1) high-density SEB interacting with the TM₁₁ and TM₃₁ modes, respectively, and 2) high output power of over 1 kW at the sub-terahertz frequency range. Two different types of 2π modes and their output characteristics were studied, and the circuit was optimized to ensure efficient outputs of two standing-wave modes. The three-dimensional (3D) particle-in-cell (PIC) simulation predicts the maximum output power of 1.3 kW with a 3-dB bandwidth of ~0.5 GHz at 303 GHz when operating at the TM₁₁ mode, and 3.18 kW, 3-dB bandwidth of ~0.85 GHz at 364 GHz when operating at the TM₃₁ mode.

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伪火花源片状电子束驱动的双模太赫兹扩展相互作用振荡器

提出了一种由伪火花源电子束驱动的太赫兹双模扩展相互作用振荡器(EIO)。新开发的电路的主要优点包括:1)高密度SEB分别与TM11和TM31模式相互作用;2)在次太赫兹频率范围内的高输出功率超过1kw。研究了两种不同类型的2π模式及其输出特性，并对电路进行了优化，以保证两种驻波模式的高效输出。三维(3D)细胞内粒子(PIC)仿真预测，工作在TM11模式下，最大输出功率为1.3 kW, 3db带宽为~0.5 GHz;工作在TM31模式下，最大输出功率为3.18 kW, 3db带宽为~0.85 GHz。

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来源期刊

Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering

CiteScore

4.30

自引率

0.00%

发文量

1362

审稿时长

99 days

期刊介绍： JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.