Platinum thin film by Ag Lα, hard x-ray photoelectron spectroscopy

IF 1.6 Q3 PHYSICS, CONDENSED MATTER Surface Science Spectra Pub Date : 2023-08-10 DOI:10.1116/6.0002800
Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina
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引用次数: 0

Abstract

Pt thin film was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.3 eV) excitation source. Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. The survey spectrum, Pt 3d, Pt 4f, Pt 4d, C 1s, and valence band core levels spectra were acquired.
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用Ag Lα,硬x射线光电子能谱研究铂薄膜
用硬x射线光电子能谱(HAXPES)对Pt薄膜进行了表征 eV)激发源。用铜双面胶带将样品固定在不锈钢样品支架上。获得了探测光谱、Pt3d、Pt4f、Pt4d、C1s和价带核能级谱。
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来源期刊
Surface Science Spectra
Surface Science Spectra PHYSICS, CONDENSED MATTER-
CiteScore
1.90
自引率
7.70%
发文量
36
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