Mechanical model analysis and reliability design approach of Quartz Flexible Accelerometer under fractured state

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2023-07-06 DOI:10.1049/cds2.12161
Tingyu Xiao, Chunxi Zhang, Lailiang Song, Longjun Ran, Wanying Huang
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Abstract

Currently, the Quartz Flexible Accelerometer (QFA) mounted for the applications working in high acceleration environment are suffering from the fracture of the flexible beams under external acceleration shock. This paper presents the mechanical model and reliability design approach of QFA to maintain the measuring ability under a fractured state. The structural parameters changed significantly in the mechanical model under a fractured state compared to those in the original model. A modified structure to maintain the measuring ability of QFA under a fractured state is designed with the reference of the sensitive module in Electrostatic Suspended Accelerometer (ESA). The corresponding close-loop system is corrected and discretised to ensure the stability requirements of the mechanical model. A static experiment is conducted to prove the effectiveness of the proposed model by a prototype QFA with completely fractured flexible beams. The result shows helpful on the preliminary research for QFA with the similar sensitive structure to ESA.

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石英挠性加速度计断裂状态下的力学模型分析及可靠性设计方法
目前,应用于高加速度环境中的石英柔性加速度计(QFA)在外部加速度冲击下会发生柔性梁断裂。本文提出了QFA在断裂状态下保持测量能力的力学模型和可靠性设计方法。与原始模型相比,断裂状态下的力学模型中的结构参数发生了显著变化。参考静电悬浮加速度计中的敏感模块,设计了一种在断裂状态下保持QFA测量能力的改进结构。对相应的闭环系统进行了校正和离散,以确保力学模型的稳定性要求。通过一个具有完全断裂柔性梁的QFA原型进行了静态实验,验证了该模型的有效性。研究结果对类似ESA灵敏结构的QFA的初步研究具有一定的指导意义。
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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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