A novel buffering fault-tolerance approach for network on chip (NoC)

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2022-08-26 DOI:10.1049/cds2.12127
Nima Jafarzadeh, Ahmad Jalili, Jafar A. Alzubi, Khosro Rezaee, Yang Liu, Mehdi Gheisari, Bahram Sadeghi Bigham, Amir Javadpour
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引用次数: 3

Abstract

Network-on-Chip (NoC) is a key component in chip multiprocessors (CMPs) as it supports communication between many cores. NoC is a network-based communication subsystem on an integrated circuit, most typically between modules in a system on a chip (SoC). Designing a reliable NoC against failures that can prevent failure using some measures or preventing error or system failure while failure happens and proper performance became a significant concern. For a reliable design against failures, first, the system should be analysed to discover the critical points. Hence, in this research, it is tried first to investigate the scale of fault tolerance effect on the mechanism in the router on the network by injecting simulated errors, and then these errors are prevented. As the major novelty, the authors implemented a router on a synchronised network and calculated the network buffering fault tolerance by injecting error in the buffer. Specifically, a new method for improving fault tolerance is proposed, which uses the existing resources efficiently. So, it does not impose any overhead on hardware and improves the error tolerance scale. The authors also evaluate it from different perspectives to show its superior performance.

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一种新的片上网络缓冲容错方法
片上网络(NoC)是芯片多处理器(CMPs)中的一个关键组件,因为它支持多核之间的通信。NoC是集成电路上基于网络的通信子系统,最典型的是在片上系统(SoC)中的模块之间。针对故障设计一个可靠的NoC,可以使用一些措施来防止故障,或者在故障发生时防止错误或系统故障,并确保适当的性能,这成为一个重要的问题。为了进行可靠的故障设计,首先,应分析系统以发现关键点。因此,在本研究中,首先试图通过注入模拟误差来研究网络上路由器中的容错机制的影响程度,然后防止这些误差。作为主要的创新,作者在同步网络上实现了一个路由器,并通过在缓冲区中注入误差来计算网络缓冲区的容错能力。具体地,提出了一种提高容错性的新方法,该方法有效地利用了现有的资源。因此,它不会对硬件造成任何开销,并提高了容错率。作者还从不同的角度对其进行了评价,以展示其卓越的性能。
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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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