Verification of serialising instructions for security against transient execution attacks

IF 1.1 4区 计算机科学 Q4 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IET Computers and Digital Techniques Pub Date : 2023-05-29 DOI:10.1049/cdt2.12058
Kushal K. Ponugoti, Sudarshan K. Srinivasan, Nimish Mathure
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Abstract

Transient execution attacks such as Spectre and Meltdown exploit speculative execution in modern microprocessors to leak information via cache side-channels. Software solutions to defend against many transient execution attacks employ the lfence serialising instruction, which does not allow instructions that come after the lfence to execute out-of-order with respect to instructions that come before the lfence. However, errors and Trojans in the hardware implementation of lfence can be exploited to compromise the software mitigations that use lfence. The aforementioned security gap has not been identified and addressed previously. The authors provide a formal method solution that addresses the verification of lfence hardware implementation. The authors also show how hardware Trojans can be designed to circumvent lfence and demonstrate that their verification approach will flag such Trojans as well. The authors have demonstrated the efficacy of our approach using RSD, which is an open source RISC-V based superscalar out-of-order processor.

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针对瞬态执行攻击的串行指令安全性验证
Spectre和Meltdown等瞬态执行攻击利用现代微处理器中的推测执行,通过缓存侧通道泄漏信息。针对许多瞬态执行攻击的软件解决方案采用lfence串行化指令,该指令不允许lfence之后的指令相对于lfence之前的指令无序执行。然而,lfence硬件实现中的错误和特洛伊木马可以被利用来破坏使用lfence的软件缓解措施。上述安全漏洞以前没有发现和解决。作者提供了一种形式化的方法解决方案,解决了lfence硬件实现的验证问题。作者还展示了如何设计硬件木马来规避lfence,并证明他们的验证方法也会标记此类木马。作者已经使用RSD证明了我们的方法的有效性,RSD是一种基于开源RISC-V的超标量无序处理器。
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来源期刊
IET Computers and Digital Techniques
IET Computers and Digital Techniques 工程技术-计算机:理论方法
CiteScore
3.50
自引率
0.00%
发文量
12
审稿时长
>12 weeks
期刊介绍: IET Computers & Digital Techniques publishes technical papers describing recent research and development work in all aspects of digital system-on-chip design and test of electronic and embedded systems, including the development of design automation tools (methodologies, algorithms and architectures). Papers based on the problems associated with the scaling down of CMOS technology are particularly welcome. It is aimed at researchers, engineers and educators in the fields of computer and digital systems design and test. The key subject areas of interest are: Design Methods and Tools: CAD/EDA tools, hardware description languages, high-level and architectural synthesis, hardware/software co-design, platform-based design, 3D stacking and circuit design, system on-chip architectures and IP cores, embedded systems, logic synthesis, low-power design and power optimisation. Simulation, Test and Validation: electrical and timing simulation, simulation based verification, hardware/software co-simulation and validation, mixed-domain technology modelling and simulation, post-silicon validation, power analysis and estimation, interconnect modelling and signal integrity analysis, hardware trust and security, design-for-testability, embedded core testing, system-on-chip testing, on-line testing, automatic test generation and delay testing, low-power testing, reliability, fault modelling and fault tolerance. Processor and System Architectures: many-core systems, general-purpose and application specific processors, computational arithmetic for DSP applications, arithmetic and logic units, cache memories, memory management, co-processors and accelerators, systems and networks on chip, embedded cores, platforms, multiprocessors, distributed systems, communication protocols and low-power issues. Configurable Computing: embedded cores, FPGAs, rapid prototyping, adaptive computing, evolvable and statically and dynamically reconfigurable and reprogrammable systems, reconfigurable hardware. Design for variability, power and aging: design methods for variability, power and aging aware design, memories, FPGAs, IP components, 3D stacking, energy harvesting. Case Studies: emerging applications, applications in industrial designs, and design frameworks.
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