Introduction to the standard reference data of electron energy loss spectra and their database: eel.geri.re.kr

Q3 Immunology and Microbiology Applied Microscopy Pub Date : 2019-12-31 DOI:10.1186/s42649-019-0015-3

Jeong Eun Chae, Ji-Soo Kim, Sang-Yeol Nam, Min Su Kim, Jucheol Park

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引用次数: 3

Abstract

Electron energy loss spectroscopy (EELS) is an analytical technique that can provide the structural, physical and chemical information of materials. The EELS spectra can be obtained by combining with TEM at sub-nanometer spatial resolution. However, EELS spectral information can’t be obtained easily because in order to interpret EELS spectra, we need to refer to and/or compare many reference data with each other. And in addition to that, we should consider the different experimental variables used to produce each data. Therefore, reliable and easily interpretable EELS standard reference data are needed.

Our Electron Energy Loss Data Center (EELDC) has been designated as National Standard Electron Energy Loss Data Center No. 34 to develop EELS standard reference (SR) data and to play a role in dissemination and diffusion of the SR data to users. EELDC has developed and collected EEL SR data for the materials required by major industries and has a total of 82 EEL SR data. Also, we have created an online platform that provides a one-stop-place to help users interpret quickly EELS spectra and get various spectral information. In this paper, we introduce EEL SR data, the homepage of EELDC and how to use them.

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电子能量损失谱的标准参考数据及其数据库:eele .geri.re.kr

电子能量损失光谱(EELS)是一种能够提供材料结构、物理和化学信息的分析技术。在亚纳米空间分辨率下，结合透射电镜可获得EELS光谱。然而，EELS光谱信息并不容易获得，因为为了解释EELS光谱，我们需要参考和/或比较许多参考数据。除此之外，我们还应该考虑用于产生每个数据的不同实验变量。因此，需要可靠且易于解释的EELS标准参考数据。我们的电子能量损失数据中心(EELDC)被指定为第34号国家标准电子能量损失数据中心，开发EELS标准参考(SR)数据，并发挥SR数据向用户传播和扩散的作用。EELDC开发并收集了主要行业所需材料的EEL SR数据，共有82个EEL SR数据。此外，我们还创建了一个在线平台，提供一站式的地方，帮助用户快速解译EELS光谱，并获得各种光谱信息。本文介绍了EEL SR数据、EELDC的主页以及如何使用这些数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Applied Microscopy Immunology and Microbiology-Applied Microbiology and Biotechnology

CiteScore

3.40

自引率

0.00%

发文量

审稿时长

10 weeks

期刊介绍： Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.