Simulation of GaSb:Te Crystal Growth in Space Experiment

Anatoly I. Prostomolotov , Nataliya A. Verezub , Alexey E. Voloshin , Tatau Nishinaga
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Abstract

An application of X-ray topography methods allowed us to construct a two-dimensional map of the impurity distribution in a GaSb:Te crystal grown under microgravity conditions. This map served as a framework for the analysis of crystal growth features and of the impurity inhomogeneity in the crystal. The data on the impurity distribution in the sample became an experimental basis for the analysis of the crystallization parameters (the crystal growth rate and the maximum convection velocity) and an adequate application of theoretical models (analytical and numerical) to explaining the mechanisms of onset of impurity inhomogeneities in the crystal.

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空间实验中GaSb:Te晶体生长的模拟
x射线形貌方法的应用使我们能够构建在微重力条件下生长的GaSb:Te晶体中杂质分布的二维图。该图作为分析晶体生长特征和晶体中杂质不均匀性的框架。样品中杂质分布的数据成为分析结晶参数(晶体生长速率和最大对流速度)和充分应用理论模型(解析和数值)来解释晶体中杂质不均匀性发生机制的实验基础。
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