Investigating time-of-flight spin-echo modulation for small-angle neutron scattering through experiments and simulation

IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Journal of Applied Crystallography Pub Date : 2015-02-02 DOI:10.1107/S1600576714025916
Morten Sales, Jeroen Plomp, Klaus Habicht, Markus Strobl
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引用次数: 8

Abstract

A spin-echo-modulated small-angle neutron scattering (SEMSANS) instrument in a time-of-flight (TOF) mode will be able to excel at pulsed neutron sources such as the European Spallation Source (ESS), currently under construction. This work compares experimental data from a TOF SEMSANS setup, where a spatial beam modulation of a white beam is obtained using triangular field coils, with Monte Carlo ray-tracing simulations. The experiments and simulations in accordance demonstrate that a good contrast can be achieved when using a constant field in the triangular coils. In the reported setup only neutrons with certain wavelengths rotate by a Larmor precession angle that spatially modulates their polarization to coincide with the period of a grating installed at the detector position. This is shown by measuring with a broad wavelength range while scanning the echo condition.

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通过实验和仿真研究了小角中子散射的飞行时间自旋回波调制
在飞行时间(TOF)模式下的自旋回波调制小角中子散射(SEMSANS)仪器将能够在脉冲中子源(如目前正在建设的欧洲散裂源(ESS))上表现出色。这项工作比较了TOF SEMSANS装置的实验数据,其中使用三角形场线圈获得白光的空间光束调制,与蒙特卡罗光线追踪模拟。实验和仿真结果表明,在三角形线圈中使用恒定场可以获得较好的对比度。在报道的装置中,只有具有特定波长的中子以拉莫尔进动角旋转,该进动角在空间上调制它们的偏振,使其与安装在探测器位置的光栅的周期一致。这是通过在扫描回波条件时测量宽波长范围来显示的。
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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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