{"title":"X-ray Diffraction-Line Broadening Analysis: Paracrystalline Method","authors":"R. Somashekar, H. Somashekarappa","doi":"10.1107/S0021889896010023","DOIUrl":null,"url":null,"abstract":"<p>Line-profile simulation and matching on the basis of a paracrystalline one-dimensional Hosemann model provides a promising approach to the analysis of line broadening. Results of analysis using X-ray wide-angle data of polymers and metallic samples are compared with Warren–Averbach multiple-order and single-order methods. Various column-length-distribution functions are also used for better agreement with the experimental profiles.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"30 2","pages":"147-152"},"PeriodicalIF":2.8000,"publicationDate":"2007-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1107/S0021889896010023","citationCount":"60","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Crystallography","FirstCategoryId":"88","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1107/S0021889896010023","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 60
Abstract
Line-profile simulation and matching on the basis of a paracrystalline one-dimensional Hosemann model provides a promising approach to the analysis of line broadening. Results of analysis using X-ray wide-angle data of polymers and metallic samples are compared with Warren–Averbach multiple-order and single-order methods. Various column-length-distribution functions are also used for better agreement with the experimental profiles.
期刊介绍：
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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