Parallel-Resonance Methods for Precise Measurements of High Impedances at Radio Frequencies and a Comparison with the Ordinary Series-Resonance Methods
{"title":"Parallel-Resonance Methods for Precise Measurements of High Impedances at Radio Frequencies and a Comparison with the Ordinary Series-Resonance Methods","authors":"D. B. Sinclair","doi":"10.1109/JRPROC.1938.228188","DOIUrl":null,"url":null,"abstract":"Two parallel-resonance methods are described which determine primarily the parallel conductance of a parallel-tuned circuit. They are most useful for measuring relatively low admittances (high impedances). Since they are duals of the reactance- and resistance-variation methods, they have been named the susceptance- and conductance-variation methods. These parallel-resonance methods are compared with the series-resonance methods with respect to range and possible sources of error. It is pointed out that, for substitution measurements, tight coupling to a constant-frequency power source need not introduce errors in measurements with either series- or parallel-resonance methods. The errors caused by residual inductance and metallic and dielectric loss in the standard condenser are discussed and numerical examples given. A precise method of interpreting resonance-curve data is presented. Experimental results are listed for measurements of high resistances by the susceptance-variation method.","PeriodicalId":54574,"journal":{"name":"Proceedings of the Institute of Radio Engineers","volume":"26 1","pages":"1466-1497"},"PeriodicalIF":0.0000,"publicationDate":"1938-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/JRPROC.1938.228188","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Institute of Radio Engineers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/JRPROC.1938.228188","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Two parallel-resonance methods are described which determine primarily the parallel conductance of a parallel-tuned circuit. They are most useful for measuring relatively low admittances (high impedances). Since they are duals of the reactance- and resistance-variation methods, they have been named the susceptance- and conductance-variation methods. These parallel-resonance methods are compared with the series-resonance methods with respect to range and possible sources of error. It is pointed out that, for substitution measurements, tight coupling to a constant-frequency power source need not introduce errors in measurements with either series- or parallel-resonance methods. The errors caused by residual inductance and metallic and dielectric loss in the standard condenser are discussed and numerical examples given. A precise method of interpreting resonance-curve data is presented. Experimental results are listed for measurements of high resistances by the susceptance-variation method.