Mis-Specification Analysis of Linear Degradation Models

IF 5 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IEEE Transactions on Reliability Pub Date : 2009-08-07 DOI:10.1109/TR.2009.2026784
Chien-Yu Peng;Sheng-Tsaing Tseng
{"title":"Mis-Specification Analysis of Linear Degradation Models","authors":"Chien-Yu Peng;Sheng-Tsaing Tseng","doi":"10.1109/TR.2009.2026784","DOIUrl":null,"url":null,"abstract":"Degradation models are widely used to assess the lifetime information of highly reliable products if there exists quality characteristics whose degradation over time can be related to reliability. The performance of a degradation model depends strongly on the appropriateness of the model describing a product's degradation path. In this paper, motivated by laser data, we propose a general linear degradation path in which the unit-to-unit variation of all test units can be considered simultaneously with the time-dependent structure in degradation paths. Based on the proposed degradation model, we first derive an implicit expression of a product's lifetime distribution, and its corresponding mean-time-to-failure (MTTF). By using the profile likelihood approach, maximum likelihood estimation of parameters, a product's MTTF, and their confidence intervals can be obtained easily. In addition, laser degradation data are used to illustrate the proposed procedure. Furthermore, we also address the effects of model mis-specification on the prediction of the product's MTTF. It shows that the effect of the model mis-specification on the predictions of a product's MTTF is not critical under the case of large samples. However, when the sample size and the termination time are not large enough, a simulation study shows that these effects are not negligible.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"58 3","pages":"444-455"},"PeriodicalIF":5.0000,"publicationDate":"2009-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TR.2009.2026784","citationCount":"315","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/5196698/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 315

Abstract

Degradation models are widely used to assess the lifetime information of highly reliable products if there exists quality characteristics whose degradation over time can be related to reliability. The performance of a degradation model depends strongly on the appropriateness of the model describing a product's degradation path. In this paper, motivated by laser data, we propose a general linear degradation path in which the unit-to-unit variation of all test units can be considered simultaneously with the time-dependent structure in degradation paths. Based on the proposed degradation model, we first derive an implicit expression of a product's lifetime distribution, and its corresponding mean-time-to-failure (MTTF). By using the profile likelihood approach, maximum likelihood estimation of parameters, a product's MTTF, and their confidence intervals can be obtained easily. In addition, laser degradation data are used to illustrate the proposed procedure. Furthermore, we also address the effects of model mis-specification on the prediction of the product's MTTF. It shows that the effect of the model mis-specification on the predictions of a product's MTTF is not critical under the case of large samples. However, when the sample size and the termination time are not large enough, a simulation study shows that these effects are not negligible.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
线性退化模型的不规范分析
退化模型被广泛用于评估高可靠性产品的寿命信息,如果存在质量特征,其随时间的退化可能与可靠性有关。退化模型的性能在很大程度上取决于描述产品退化路径的模型的适当性。在本文中,受激光数据的激励,我们提出了一种通用的线性退化路径,其中所有测试单元的单元间变化可以与退化路径中的时间相关结构同时考虑。基于所提出的退化模型,我们首先推导了产品寿命分布的隐式表达式,以及相应的平均失效时间(MTTF)。通过使用轮廓似然法,可以很容易地获得参数的最大似然估计、产品的MTTF及其置信区间。此外,还使用激光降解数据来说明所提出的程序。此外,我们还讨论了模型错误规范对产品MTTF预测的影响。这表明,在大样本的情况下,模型错误规范对产品MTTF预测的影响并不重要。然而,当样本量和终止时间不够大时,一项模拟研究表明,这些影响是不可忽略的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
IEEE Transactions on Reliability
IEEE Transactions on Reliability 工程技术-工程:电子与电气
CiteScore
12.20
自引率
8.50%
发文量
153
审稿时长
7.5 months
期刊介绍: IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.
期刊最新文献
Table of Contents IEEE Reliability Society Information Editorial: Applied AI for Reliability and Cybersecurity 2024 Index IEEE Transactions on Reliability Vol. 73 Table of Contents
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1