{"title":"Mis-Specification Analysis of Linear Degradation Models","authors":"Chien-Yu Peng;Sheng-Tsaing Tseng","doi":"10.1109/TR.2009.2026784","DOIUrl":null,"url":null,"abstract":"Degradation models are widely used to assess the lifetime information of highly reliable products if there exists quality characteristics whose degradation over time can be related to reliability. The performance of a degradation model depends strongly on the appropriateness of the model describing a product's degradation path. In this paper, motivated by laser data, we propose a general linear degradation path in which the unit-to-unit variation of all test units can be considered simultaneously with the time-dependent structure in degradation paths. Based on the proposed degradation model, we first derive an implicit expression of a product's lifetime distribution, and its corresponding mean-time-to-failure (MTTF). By using the profile likelihood approach, maximum likelihood estimation of parameters, a product's MTTF, and their confidence intervals can be obtained easily. In addition, laser degradation data are used to illustrate the proposed procedure. Furthermore, we also address the effects of model mis-specification on the prediction of the product's MTTF. It shows that the effect of the model mis-specification on the predictions of a product's MTTF is not critical under the case of large samples. However, when the sample size and the termination time are not large enough, a simulation study shows that these effects are not negligible.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"58 3","pages":"444-455"},"PeriodicalIF":5.0000,"publicationDate":"2009-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1109/TR.2009.2026784","citationCount":"315","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/5196698/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 315
Abstract
Degradation models are widely used to assess the lifetime information of highly reliable products if there exists quality characteristics whose degradation over time can be related to reliability. The performance of a degradation model depends strongly on the appropriateness of the model describing a product's degradation path. In this paper, motivated by laser data, we propose a general linear degradation path in which the unit-to-unit variation of all test units can be considered simultaneously with the time-dependent structure in degradation paths. Based on the proposed degradation model, we first derive an implicit expression of a product's lifetime distribution, and its corresponding mean-time-to-failure (MTTF). By using the profile likelihood approach, maximum likelihood estimation of parameters, a product's MTTF, and their confidence intervals can be obtained easily. In addition, laser degradation data are used to illustrate the proposed procedure. Furthermore, we also address the effects of model mis-specification on the prediction of the product's MTTF. It shows that the effect of the model mis-specification on the predictions of a product's MTTF is not critical under the case of large samples. However, when the sample size and the termination time are not large enough, a simulation study shows that these effects are not negligible.
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.