{"title":"High-Efficiency Field-Free Spin-Orbit Switching Based on PtW Alloy Layer","authors":"Xiangyu Liu;Xiukai Lan;Zelalem Abebe Bekele;Weihao Li;Shouguo Zhu;Pengwei Dou;Yuanbo Wang;Jingyan Zhang;Shouguo Wang;Kaiyou Wang","doi":"10.1109/TNANO.2023.3313313","DOIUrl":null,"url":null,"abstract":"Current-driven spin-orbit-torque (SOT)-induced device is a promising candidate with nonvolatility, low energy consumption, and ultrafast speed for the next-generation storage and computing technique. However, the requirement of the assistant magnetic field hinders its application. Besides, the switching current density in SOT-induced devices still needs to be further reduced. Here, we prepared devices with stacks of Ta/Pt<sub>100-<italic>x</italic></sub>W<italic><sub>x</sub></italic>/Co/AlO<italic><sub>y</sub></italic>/Pt and systematically investigated changes in the switching efficiency with W content. A high damping-like effective field per unit current density <italic>η</italic><sub>DL</sub> up to 40.57 ± 3.32 (Oe/(10<sup>6</sup> A/cm<sup>2</sup>)) was observed in the device with a Pt<sub>74</sub>W<sub>26</sub> layer, which is one order of magnitude higher than that in the typical spin-orbit devices with pure heavy metal layer reported in the previous articles. In addition, field-free switching is observed in devices with a wide range of W content using the competing spin currents generated from the Pt<sub>100-<italic>x</italic></sub>W<italic><sub>x</sub></italic> layer. Zero-field switching (ZFS) critical current densities of them are less than 1.09 ± 0.05 (10<sup>7</sup> A/cm<sup>2</sup>) with the minimum of 1.58 ± 0.13 (10<sup>6</sup> A/cm<sup>2</sup>), indicating the highly efficient field-free spin-orbit switching in the PtW system. Our findings pave the way to high-energy-efficiency spin-orbit devices.","PeriodicalId":449,"journal":{"name":"IEEE Transactions on Nanotechnology","volume":"22 ","pages":"576-580"},"PeriodicalIF":2.1000,"publicationDate":"2023-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10244052/","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Current-driven spin-orbit-torque (SOT)-induced device is a promising candidate with nonvolatility, low energy consumption, and ultrafast speed for the next-generation storage and computing technique. However, the requirement of the assistant magnetic field hinders its application. Besides, the switching current density in SOT-induced devices still needs to be further reduced. Here, we prepared devices with stacks of Ta/Pt100-xWx/Co/AlOy/Pt and systematically investigated changes in the switching efficiency with W content. A high damping-like effective field per unit current density ηDL up to 40.57 ± 3.32 (Oe/(106 A/cm2)) was observed in the device with a Pt74W26 layer, which is one order of magnitude higher than that in the typical spin-orbit devices with pure heavy metal layer reported in the previous articles. In addition, field-free switching is observed in devices with a wide range of W content using the competing spin currents generated from the Pt100-xWx layer. Zero-field switching (ZFS) critical current densities of them are less than 1.09 ± 0.05 (107 A/cm2) with the minimum of 1.58 ± 0.13 (106 A/cm2), indicating the highly efficient field-free spin-orbit switching in the PtW system. Our findings pave the way to high-energy-efficiency spin-orbit devices.
期刊介绍:
The IEEE Transactions on Nanotechnology is devoted to the publication of manuscripts of archival value in the general area of nanotechnology, which is rapidly emerging as one of the fastest growing and most promising new technological developments for the next generation and beyond.