{"title":"Selected Area XPS Analysis for Identification of Pigment Compounds in Microscopic Paint Flakes","authors":"B. James, R. Cameron, Camilla Baskcomb","doi":"10.1155/2008/247053","DOIUrl":null,"url":null,"abstract":"The application of X-ray photoelectron spectroscopy to the analysis of paint flakes from a painting by Henry Fuseli (1741–1825) is presented. Historically, the application of XPS to art conservation and restoration studies has been limited by the poor spatial resolution of the technique. Presented here is the successful analysis of paint flakes in the order of 100 𝜇 m using “imaging” XPS in conjunction with selected area analysis. Raman microscopy failed to satisfactorily identify the compounds present in this instance, and energy dispersive spectroscopy could not differentiate between lead and sulphur (two of the elements of interest) due to the limited energy resolution inherent in that technique. Using XPS analysis of the lead 4f peak revealed that the pigment was a lead-based pigment, in this case comprising exclusively lead-sulphur compounds.","PeriodicalId":7345,"journal":{"name":"Advances in Materials Science and Engineering","volume":"2008 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1155/2008/247053","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in Materials Science and Engineering","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1155/2008/247053","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 6
Abstract
The application of X-ray photoelectron spectroscopy to the analysis of paint flakes from a painting by Henry Fuseli (1741–1825) is presented. Historically, the application of XPS to art conservation and restoration studies has been limited by the poor spatial resolution of the technique. Presented here is the successful analysis of paint flakes in the order of 100 𝜇 m using “imaging” XPS in conjunction with selected area analysis. Raman microscopy failed to satisfactorily identify the compounds present in this instance, and energy dispersive spectroscopy could not differentiate between lead and sulphur (two of the elements of interest) due to the limited energy resolution inherent in that technique. Using XPS analysis of the lead 4f peak revealed that the pigment was a lead-based pigment, in this case comprising exclusively lead-sulphur compounds.
期刊介绍：
Advances in Materials Science and Engineering is a broad scope journal that publishes articles in all areas of materials science and engineering including, but not limited to:
-Chemistry and fundamental properties of matter
-Material synthesis, fabrication, manufacture, and processing
-Magnetic, electrical, thermal, and optical properties of materials
-Strength, durability, and mechanical behaviour of materials
-Consideration of materials in structural design, modelling, and engineering
-Green and renewable materials, and consideration of materials’ life cycles
-Materials in specialist applications (such as medicine, energy, aerospace, and nanotechnology)
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