{"title":"The Method of Modal Parameters for the Wire Segments With Symmetrical Geometry and Singularity Expansion Method","authors":"Sergey V. Tkachenko;Felix Middelstaedt;Ralf Vick","doi":"10.1109/LEMCPA.2021.3132254","DOIUrl":null,"url":null,"abstract":"The previously developed Method of Modal Parameters (MoMP) was applied to calculate the Singularity Expansion Method (SEM) poles of the single and double wire segments with symmetrical geometry: straight wire, circular wire and helix wire, which are important for EMC practice. The symmetry leads to the simplification of the corresponding formulas for matrix elements and allows to obtain SEM poles of the first, second and third layers, which correspond both to the known analytical results and numerical data. Moreover, for the first layer of the poles one can use a simplified variant of the method taking into account only diagonal elements of the p.u.l. impedance matrix.","PeriodicalId":100625,"journal":{"name":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","volume":"4 1","pages":"2-6"},"PeriodicalIF":0.9000,"publicationDate":"2021-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Letters on Electromagnetic Compatibility Practice and Applications","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/9650589/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 2
Abstract
The previously developed Method of Modal Parameters (MoMP) was applied to calculate the Singularity Expansion Method (SEM) poles of the single and double wire segments with symmetrical geometry: straight wire, circular wire and helix wire, which are important for EMC practice. The symmetry leads to the simplification of the corresponding formulas for matrix elements and allows to obtain SEM poles of the first, second and third layers, which correspond both to the known analytical results and numerical data. Moreover, for the first layer of the poles one can use a simplified variant of the method taking into account only diagonal elements of the p.u.l. impedance matrix.