{"title":"Resonance shifting by ferrite thick film superstrate","authors":"M. K. Rendale, S. Mathad, V. Puri","doi":"10.2298/SJEE1803275R","DOIUrl":null,"url":null,"abstract":"Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing technique on alumina substrates. Structural analysis was undertaken using X-ray diffraction and Scanning electron microscopy techniques. A new approach for the determination of complex permittivity ( and ) using microwave property perturbation is unveiled. Ag thick film microstrip ring resonator (MSRR) with and without the thick film substrate was used for the microwave transmission studies in the frequency region of 812 GHz. The microwave conductivity of the thick films lies in the range of 1.779 S/cm to 2.296 S/cm. The penetration depth is also reported within the X-band of microwave frequencies.","PeriodicalId":37704,"journal":{"name":"Serbian Journal of Electrical Engineering","volume":"15 1","pages":"275-284"},"PeriodicalIF":0.0000,"publicationDate":"2018-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Serbian Journal of Electrical Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2298/SJEE1803275R","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 2
Abstract
Fritless thick films of Ni-Co-Zn ferrites were fabricated by screen printing technique on alumina substrates. Structural analysis was undertaken using X-ray diffraction and Scanning electron microscopy techniques. A new approach for the determination of complex permittivity ( and ) using microwave property perturbation is unveiled. Ag thick film microstrip ring resonator (MSRR) with and without the thick film substrate was used for the microwave transmission studies in the frequency region of 812 GHz. The microwave conductivity of the thick films lies in the range of 1.779 S/cm to 2.296 S/cm. The penetration depth is also reported within the X-band of microwave frequencies.
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