The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra.

IF 1.3 4区工程技术 Q3 INSTRUMENTS & INSTRUMENTATION Journal of Research of the National Institute of Standards and Technology Pub Date : 2022-03-09 eCollection Date: 2021-01-01 DOI:10.6028/jres.126.049

Csilla I Szabo, James P Cline, Albert Henins, Lawrence T Hudson, Marcus H Mendenhall

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Abstract

The NIST Vacuum Double-Crystal Spectrometer (VDCS) has been modernized and is now capable of recording reference-free wavelength-dispersive spectra in the 2 keV to 12 keV x-ray energy range. The VDCS employs crystals in which the lattice spacings are traceable to the definition of the meter through x-ray optical interferometry with a relative uncertainty ﹤10-⁸. VDCS wavelength determination relies upon precision angle difference measurements for which the encoders of the rotation stages have been calibrated using the circle closure method for accurate, absolute angle measurement. The new vacuum-compatible area detector allows quantification of the aberration functions contributing to the observed line shape and in situ alignment of the crystal optics. This latter procedure is augmented with the use of a thin lamella as the first crystal. With these new techniques, x-ray spectra are registered with the VDCS on an absolute energy scale with a relative uncertainty of 10-⁶.

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NIST 真空双晶光谱仪：可追溯 SI 的 X 射线发射光谱测量工具。

NIST 真空双晶光谱仪（VDCS）已实现现代化，现在能够记录 2 keV 至 12 keV X 射线能量范围内的无参考波长色散光谱。VDCS 使用的晶体，其晶格间距可通过 X 射线光学干涉测量法追溯到仪表的定义，相对不确定性﹤10-⁸。VDCS 波长的确定依赖于精确的角度差测量，旋转平台的编码器已使用圆闭合法进行了校准，以实现精确的绝对角度测量。新的真空兼容面积探测器可以对造成观测线形的像差函数进行量化，并对晶体光学器件进行现场校准。使用薄片作为第一晶体，可以增强后一种程序。利用这些新技术，X 射线光谱可以在绝对能量范围内与 VDCS 进行登记，相对不确定性为 10-⁶。

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来源期刊

Journal of Research of the National Institute of Standards and Technology 工程技术-物理：应用

自引率

33.30%

发文量

审稿时长

>12 weeks

期刊介绍： The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.