{"title":"Extended FF and VOC Parameterizations for Silicon Solar Cells","authors":"Karsten Bothe;David Hinken;Rolf Brendel","doi":"10.1109/JPHOTOV.2023.3309932","DOIUrl":null,"url":null,"abstract":"This work is concerned with maximal and currently obtained fill factors of crystalline silicon solar cells. Recent research activities have led to a drastically decreased recombination in the volume as well as at the surfaces and interfaces of crystalline silicon solar cells. As a result, open-circuit voltages \n<inline-formula><tex-math>$({{V}_{\\text{OC}}})$</tex-math></inline-formula>\n and fill factor \n<inline-formula><tex-math>$({\\textit{FF}})$</tex-math></inline-formula>\n values increased significantly. In order to classify how good the achieved improvements are, it is necessary to know the maximum achievable values. Unfortunately, there is no explicit expression for the \n<inline-formula><tex-math>${\\textit{FF}}$</tex-math></inline-formula>\n in terms of other characteristic solar cell parameters. For this reason, the empirical \n<inline-formula><tex-math>${\\textit{FF}}_{0}$</tex-math></inline-formula>\n-relation by Green is widely used to predict upper \n<inline-formula><tex-math>${\\textit{FF}}$</tex-math></inline-formula>\n bounds for a given \n<inline-formula><tex-math>${V}_{\\text{OC}}$</tex-math></inline-formula>\n. In order to evaluate to what extent Green's relation is a good approximation to recently obtained values, we study \n<inline-formula><tex-math>${\\textit{FF}}$</tex-math></inline-formula>\n–\n<inline-formula><tex-math>${V}_{\\text{OC}}$</tex-math></inline-formula>\n relations for ideal resistance-free single junction silicon solar cells limited by intrinsic recombination using state-of-the-art analytical models. The obtained upper bounds are compared with recently published record values showing that all values stay below the intrinsic limit. We provide parameterizations of \n<inline-formula><tex-math>${V}_{\\text{OC}}$</tex-math></inline-formula>\n and \n<inline-formula><tex-math>${\\textit{FF}}$</tex-math></inline-formula>\n as a function of sample thickness \n<italic>w</i>\n and base dopant density \n<inline-formula><tex-math>${N}_{\\text{dop}}$</tex-math></inline-formula>\n.","PeriodicalId":445,"journal":{"name":"IEEE Journal of Photovoltaics","volume":"13 6","pages":"787-792"},"PeriodicalIF":2.5000,"publicationDate":"2023-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Photovoltaics","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10251700/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENERGY & FUELS","Score":null,"Total":0}
引用次数: 0
Abstract
This work is concerned with maximal and currently obtained fill factors of crystalline silicon solar cells. Recent research activities have led to a drastically decreased recombination in the volume as well as at the surfaces and interfaces of crystalline silicon solar cells. As a result, open-circuit voltages
$({{V}_{\text{OC}}})$
and fill factor
$({\textit{FF}})$
values increased significantly. In order to classify how good the achieved improvements are, it is necessary to know the maximum achievable values. Unfortunately, there is no explicit expression for the
${\textit{FF}}$
in terms of other characteristic solar cell parameters. For this reason, the empirical
${\textit{FF}}_{0}$
-relation by Green is widely used to predict upper
${\textit{FF}}$
bounds for a given
${V}_{\text{OC}}$
. In order to evaluate to what extent Green's relation is a good approximation to recently obtained values, we study
${\textit{FF}}$
–
${V}_{\text{OC}}$
relations for ideal resistance-free single junction silicon solar cells limited by intrinsic recombination using state-of-the-art analytical models. The obtained upper bounds are compared with recently published record values showing that all values stay below the intrinsic limit. We provide parameterizations of
${V}_{\text{OC}}$
and
${\textit{FF}}$
as a function of sample thickness
w
and base dopant density
${N}_{\text{dop}}$
.
期刊介绍:
The IEEE Journal of Photovoltaics is a peer-reviewed, archival publication reporting original and significant research results that advance the field of photovoltaics (PV). The PV field is diverse in its science base ranging from semiconductor and PV device physics to optics and the materials sciences. The journal publishes articles that connect this science base to PV science and technology. The intent is to publish original research results that are of primary interest to the photovoltaic specialist. The scope of the IEEE J. Photovoltaics incorporates: fundamentals and new concepts of PV conversion, including those based on nanostructured materials, low-dimensional physics, multiple charge generation, up/down converters, thermophotovoltaics, hot-carrier effects, plasmonics, metamorphic materials, luminescent concentrators, and rectennas; Si-based PV, including new cell designs, crystalline and non-crystalline Si, passivation, characterization and Si crystal growth; polycrystalline, amorphous and crystalline thin-film solar cell materials, including PV structures and solar cells based on II-VI, chalcopyrite, Si and other thin film absorbers; III-V PV materials, heterostructures, multijunction devices and concentrator PV; optics for light trapping, reflection control and concentration; organic PV including polymer, hybrid and dye sensitized solar cells; space PV including cell materials and PV devices, defects and reliability, environmental effects and protective materials; PV modeling and characterization methods; and other aspects of PV, including modules, power conditioning, inverters, balance-of-systems components, monitoring, analyses and simulations, and supporting PV module standards and measurements. Tutorial and review papers on these subjects are also published and occasionally special issues are published to treat particular areas in more depth and breadth.