{"title":"Eddy current defect characterization using neural networks","authors":"Udpa L., Udpa S.S.","doi":"10.1016/0308-9126(90)90883-P","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"23 6","pages":"Page 358"},"PeriodicalIF":0.0000,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0308-9126(90)90883-P","citationCount":"78","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NDT International","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/030891269090883P","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 78
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