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Eddy-current signal analysis and inversion for semielliptical surface cracks : Journal of nondestructive evaluation, Vol. 7, Nos 1–2, pp. 79–94 (Jun. 1988) 半椭圆表面裂纹的涡流信号分析与反演,无损评价,Vol. 7, no . 1-2, pp. 79-94 (6 . 1988)
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90913-9
B. Auld, S. Jefferies, J. Moulder
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引用次数: 0
Analysis of the remote-field eddy current effect in nonmagnetic tubes 非磁管中远场涡流效应分析
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90954-M
Sullivan S., Atherton D.L.
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引用次数: 3
Thickness touchless measurements using eddy current sensors 使用涡流传感器进行厚度无接触测量
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90870-T
Placko D., Sol C., Jacob D.
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引用次数: 0
Critical comments on the use of X-rays and Ir-192 for detecting linear discontinuities 关于使用X射线和Ir-192检测线性不连续性的批评性意见
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90860-Q
P. Ciorau

A notched IQI in nine variants was used to draw detectability curves (depth versus width) for steel specimens 6 to 48 mm in thickness, using X-ray and Ir-192 sources with appropriate focus sizes, and AGFA films D3, D4, D5 and D7. The crack detection index (CDI) of the slit IQI has a good correlation with the crack probability of detection (POD) for a CrMoV welded joint (28 mm thick) with induced thermo-mechanical cracks. POD depends on film type (± 10% class−1) and film density (±50% for optical density variation between D = 1.5 – 3.5). The major influences of unsharpness and irradiation angle upon POD are also presented. The difference in sensitivity between X-rays and Ir-192 gamma rays can be explained by ‘energy-unsharpness’ factor variation with thickness. A correlation between slit IQI parameter (depth = width) and DIN (wire) IQI diameter was found. An experimental formula between CDI and total unsharpness (ut) for X-rays and film density D = 2.5 – 3.0 was also found: Fut.CDI = 2.1, where F = 0.87–1.0 is a film factor.

Proposals for codes of good practice, to obtain good ‘crack sensitivity’ based on the presented data, are given.

使用具有适当焦点尺寸的X射线和Ir-192源以及AGFA薄膜D3、D4、D5和D7,使用九种变体的缺口像质计绘制厚度为6至48mm的钢试样的可检测性曲线(深度与宽度)。对于具有诱发热机械裂纹的CrMoV焊接接头(28mm厚),狭缝像质计的裂纹检测指数(CDI)与裂纹检测概率(POD)具有良好的相关性。POD取决于膜类型(±10%的-1级)和膜密度(光密度在D=1.5–3.5之间变化时为±50%)。还介绍了不清晰度和照射角度对POD的主要影响。X射线和Ir-192伽马射线之间灵敏度的差异可以用“能量不清晰度”因子随厚度的变化来解释。狭缝像质计参数(深度=宽度)和DIN(线)像质计直径之间存在相关性。还发现了CDI与X射线和胶片密度D=2.5–3.0的总不清晰度(ut)之间的实验公式:Fut.CDI=2.1,其中F=0.87–1.0是胶片因子。根据所提供的数据,提出了良好实践规范的建议,以获得良好的“裂纹敏感性”。
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引用次数: 5
Eddy-current inversion of flaw data from flat-bottomed holes 平底孔缺陷数据的涡流反演
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90886-S
Dodd C.V., Pate J.R., Deeds W.E.
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引用次数: 0
Detection and investigation of defects in nondestructive testing by use of Foucault (eddy) currents (In French: English Abstract) 福柯(涡流)无损检测中缺陷的检测和调查(法语:英文摘要)
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90908-7
Gaillard P., Simard P., Colin N.
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引用次数: 0
Eddy current methods for the detection of defects in boiler tubes 锅炉管缺陷的涡流检测方法
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90928-H
Koosha A.
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引用次数: 0
NDT abstractEddy-current inversion of flaw data from flat-bottomed holes : Review of progress in quantitative nondestructive evaluation, Vol. 8A. Edited by D.C. Thompson and D.E. Chimenti, pp. 305–312. Plenum Press (1989), ISBN 0 306 43209 9 无损探伤技术的研究进展。无损探伤技术,Vol. 8A。由D.C.汤普森和D.E. Chimenti编辑,第305-312页。全会出版社(1989),ISBN 0 306 43209 9
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90886-S
C. Dodd, J. Pate, W. Deeds
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引用次数: 0
Solution of inverse problems in eddy-current nondestructive evaluation (NDE) : Journal of nondestructive evaluation, Vol. 7, Nos 1–2, pp. 111–120 (Jun. 1988) 涡流无损检测(NDE)中逆问题的求解,无损检测学报,Vol. 7, no . 1-2, pp. 111-120 (1988)
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90912-8
L. Udpa, S. Udpa
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引用次数: 0
Eddy-current detection methods for surface-breaking tight cracks : Review of progress in quantitative nondestructive evaluation, Vol. 8A. Edited by D.C. Thompson and D.E. Chimenti, pp. 245–250. Plenum Press (1989), ISBN 0 306 43209 9 表面断裂紧密裂纹的涡流检测方法:定量无损评价进展综述,Vol. 8A。由D.C.汤普森和D.E. Chimenti编辑,245-250页。全会出版社(1989),ISBN 0 306 43209 9
Pub Date : 1990-12-01 DOI: 10.1016/0308-9126(90)90888-U
N. Nakagawa
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引用次数: 0
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