Recent advances in wide-spectrum photodetectors based on low-dimensional semiconductors

Yali Yu , Yin Hu , Juehan Yang , Zhongming Wei
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引用次数: 4

Abstract

Compared with three-dimensional semiconductors, low-dimensional (LD) semiconductors have unique atomic arrangements and excellent optical and electrical characteristics, such as high absorptivity, mechanical flexibility, and absence of dangling bonds on the surface. With these advantages, LD semiconductors are considered as a kind of promising materials in the field of photodetection. However, the applications of LD materials are limited by their dimensional constraint, large dark current, high noise, low quantum efficiency, slow response speed, and other characteristics. In this paper, the recent advances in wide-spectrum photodetectors in the ultraviolet to infrared spectrum are reviewed. The working mechanisms and performance parameters of photodetectors are described. Specific research examples based on wide-spectrum photodetectors are reviewed based on three aspects, namely the structure of photodetectors, their response mechanisms, and important performance indicators. Furthermore, the challenges in improving the performance of wide-spectrum photodetectors are discussed, along with the prospective development trends of wide-spectrum photodetectors.

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基于低维半导体的宽光谱光电探测器的最新进展
与三维半导体相比,低维(LD)半导体具有独特的原子排列和优异的光学和电学特性,如高吸收率、机械柔性和表面不存在悬空键。由于这些优点,LD半导体被认为是光电探测领域中一种很有前途的材料。然而,LD材料的应用受到其尺寸约束、大暗电流、高噪声、低量子效率、慢响应速度等特性的限制。本文综述了紫外-红外光谱宽光谱光电探测器的最新进展。介绍了光电探测器的工作机理和性能参数。从光电探测器的结构、响应机制和重要性能指标三个方面综述了基于宽光谱光电探测器的具体研究实例。此外,还讨论了提高宽光谱光电探测器性能的挑战,以及宽光谱光电检测器的发展趋势。
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