Impact of materials on back-contact module reliability

M. Guichoux, C. Tjengdrawira, D. Veldman, P. D. de Jong
{"title":"Impact of materials on back-contact module reliability","authors":"M. Guichoux, C. Tjengdrawira, D. Veldman, P. D. de Jong","doi":"10.1109/PVSC.2010.5615877","DOIUrl":null,"url":null,"abstract":"This paper discusses the impact of several combinations of encapsulants, conductive adhesives and back-sheet foils on ECN's back-contact modules performance and reliability. Damp-heat (85°C; 85% R.H) and thermal cycling (−40°C; +85°C) tests were performed up to twice as long as described in the IEC-61215 standard, i.e. 2000 hours of damp-heat and 400 thermal cycles. These tests have been identified as the most important tests for this technology. After climatic chamber testing, the modules were analyzed visually and by electro-luminescence imaging.","PeriodicalId":6424,"journal":{"name":"2010 35th IEEE Photovoltaic Specialists Conference","volume":"26 11","pages":"002869-002872"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 35th IEEE Photovoltaic Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2010.5615877","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

This paper discusses the impact of several combinations of encapsulants, conductive adhesives and back-sheet foils on ECN's back-contact modules performance and reliability. Damp-heat (85°C; 85% R.H) and thermal cycling (−40°C; +85°C) tests were performed up to twice as long as described in the IEC-61215 standard, i.e. 2000 hours of damp-heat and 400 thermal cycles. These tests have been identified as the most important tests for this technology. After climatic chamber testing, the modules were analyzed visually and by electro-luminescence imaging.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
材料对背触点模块可靠性的影响
本文讨论了密封剂、导电胶粘剂和背片箔的几种组合对ECN背接触模块性能和可靠性的影响。湿热(85°C;85% R.H)和热循环(- 40°C;+85°C)测试的执行时间是IEC-61215标准所述时间的两倍,即2000小时的湿热和400个热循环。这些测试已被确定为该技术最重要的测试。经过气候室测试,对组件进行了视觉分析和电致发光成像。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Reaching grid parity using BP Solar crystalline silicon technology Interaction between post wire saw cleaning and the subsequent cell fabrication saw damage etch and texturing process Durability evaluation of InGaP/GaAs/Ge triple-junction solar cells in HIHT environments for Mercury exploration mission Impact of materials on back-contact module reliability Paste development for screen printed mc-Si MWT solar cells exceeding 17% efficiency
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1