Measurements of third-order optical nonlinearity using Z-scan technique: A review

Vijender Singh, P. kharangarh, Parveen Kumar, D. Singh, Sanjay, A. Ghosh, Sanjay Kumar
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引用次数: 2

Abstract

Optical materials exhibiting a large third-order optical nonlinearity are in great demands because of their functional applications in optical limiting, optical switching, optical data storage etc. A well-known single Z-scan technique is employed to determine third-order nonlinear optical properties of nonlinear optical materials. Z-scan is a simple experimental technique to measure intensity dependent nonlinear susceptibilities of third-order nonlinear optical materials. It was originally introduced by Sheik Bahae et.al. In this technique, the sample is translated in the z-direction along the axis of a focused Gaussian beam, and the far field intensity is measured as function of sample position. Consequently, increases and decreases in the maximum intensity incident on the sample produce wavefront distortions created by nonlinear optical effects. This is a simple and sensitive single beam technique to measure the sign and magnitude of both real and imaginary part of the third order nonlinear susceptibility χ(3) of nonlinear optical materials.Optical materials exhibiting a large third-order optical nonlinearity are in great demands because of their functional applications in optical limiting, optical switching, optical data storage etc. A well-known single Z-scan technique is employed to determine third-order nonlinear optical properties of nonlinear optical materials. Z-scan is a simple experimental technique to measure intensity dependent nonlinear susceptibilities of third-order nonlinear optical materials. It was originally introduced by Sheik Bahae et.al. In this technique, the sample is translated in the z-direction along the axis of a focused Gaussian beam, and the far field intensity is measured as function of sample position. Consequently, increases and decreases in the maximum intensity incident on the sample produce wavefront distortions created by nonlinear optical effects. This is a simple and sensitive single beam technique to measure the sign and magnitude of both real and imaginary part of the third order nonlinear susceptibili...
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用z扫描技术测量三阶光学非线性:综述
具有较大三阶光非线性的光学材料在光限幅、光开关、光数据存储等方面的应用越来越受到人们的重视。采用一种著名的单z扫描技术来测定非线性光学材料的三阶非线性光学性质。z扫描是一种测量三阶非线性光学材料强度相关非线性磁化率的简单实验技术。它最初是由Sheik Bahae等人介绍的。在这种技术中,样品沿着聚焦高斯光束的轴线在z方向上平移,远场强度作为样品位置的函数被测量。因此,入射到样品上的最大强度的增加和减少会产生非线性光学效应造成的波前畸变。这是一种简单而灵敏的单光束技术,用于测量非线性光学材料的三阶非线性磁化率χ(3)的实部和虚部的符号和大小。具有较大三阶光非线性的光学材料在光限幅、光开关、光数据存储等方面的应用越来越受到人们的重视。采用一种著名的单z扫描技术来测定非线性光学材料的三阶非线性光学性质。z扫描是一种测量三阶非线性光学材料强度相关非线性磁化率的简单实验技术。它最初是由Sheik Bahae等人介绍的。在这种技术中,样品沿着聚焦高斯光束的轴线在z方向上平移,远场强度作为样品位置的函数被测量。因此,入射到样品上的最大强度的增加和减少会产生非线性光学效应造成的波前畸变。这是一种简单而灵敏的单光束技术,用于测量三阶非线性磁化率的实部和虚部的符号和幅度。
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