Indirect Evaluation of the Electrocaloric Effect in PbZrTiO3 (20/80)-Based Epitaxial Thin Film Structures

G. Boni, L. Filip, C. Radu, C. Chirila, I. Pasuk, M. Botea, I. Pintilie, L. Pintilie
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Abstract

Electrocaloric effect is the adiabatic temperature change in a dielectric material when an electric field is applied or removed, and it can be considered as an alternative refrigeration method. Materials with ferroelectric order exhibit large temperature variations in the vicinity of a phase transition, while antiferroelectrics and relaxors may exhibit a negative electrocaloric effect. In this study, the temperature variation in polarization was investigated for epitaxial ferroelectric thin film structures based on PbZrTiO3 materials in simple or complex multilayered structures. We propose the intriguing possibility of a giant negative electrocaloric effect (ΔT = −3.7 K at room temperature and ΔT = −5.5 K at 370 K) in a simple epitaxial Pb(ZrTi)O3 capacitor. Furthermore, it was shown that abnormal temperature variation in polarization is dependent on the non-FE component introduced in a multilayered structure. No significant variation in polarization with temperature was obtained for PZT/STON multilayered structures around room temperature. However, for PZT/BST or PZT/Nb2O5 multilayers, an abnormal temperature variation in polarization was revealed, which was similar to a simple PZT layer. The giant and negative ∆T values were attributed to internal fields and defects formed due to the large depolarization fields when the high polarization of the FE component was not fully compensated either by the electrodes or by the interface with an insulator layer. The presented results make Pb(ZrTi)O3-based structures promising for cooling applications operating near room temperature.
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PbZrTiO3(20/80)基外延薄膜结构中电热效应的间接评价
电热效应是施加或去除电场时介电材料的绝热温度变化,它可以被认为是一种替代的制冷方法。具有铁电序的材料在相变附近表现出较大的温度变化,而反铁电体和弛豫体可能表现出负的电热效应。在本研究中,研究了基于PbZrTiO3材料的外延铁电薄膜结构在简单和复杂多层结构中的极化温度变化。我们提出了在简单的外延Pb(ZrTi)O3电容器中产生巨大负电热效应(在室温下ΔT =−3.7 K,在370 K下ΔT =−5.5 K)的有趣可能性。此外,研究还表明,极化的异常温度变化与多层结构中引入的非fe分量有关。在室温附近,PZT/STON多层结构的极化随温度变化不显著。然而,对于PZT/BST或PZT/Nb2O5多层膜,极化温度变化异常,类似于简单的PZT层。巨大的∆T值和负的∆T值是由于内部场和大去极化场造成的,当FE组件的高极化没有被电极或与绝缘子层的界面完全补偿时。这些结果使得Pb(ZrTi) o3基结构在室温下的冷却应用前景广阔。
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