Creep behavior of joint-scale Sn1.0Ag0.5Cu solder shear samples

C. Burke, J. Punch, M. Collins
{"title":"Creep behavior of joint-scale Sn1.0Ag0.5Cu solder shear samples","authors":"C. Burke, J. Punch, M. Collins","doi":"10.1109/ECTC.2012.6248878","DOIUrl":null,"url":null,"abstract":"This study investigates the creep behavior of joint-scale Sn1.0Ag0.5Cu (SAC105) solder samples under shear loading. The objective of the work is to determine the Anand viscoplastic constitutive model parameters for this low silver content ternary SAC solder alloy. A series of monotonic constant shear stress (5-15MPa) and constant shear strain rate (1E-6-1E-2 (1/s)) tests was conducted at temperatures of 20°C, 50°C, 75°C and 100°C in order to provide data to extract the constitutive model parameters. The predictions of the Anand model are compared graphically with the experimental data in order to illustrate goodness-of-fit. SAC105 was found to be more creep resistant at higher strain rates than at lower strain rates for all temperatures and test conditions. The derived Anand parameters are shown to capture the creep performance of the SAC105 solder under shear loading very well, with the experimental data being tightly bound to the Anand predictions. In addition to the quantification of mechanical characteristics, a preliminary Electron Backscatter Diffraction (EBSD) investigation was conducted to investigate the effect of preconditioning on the grain structure of SAC105 solder joints. Results indicate that the misorientaion of the solder grains increased during preconditioning, signaling grain coarsening due to ageing.","PeriodicalId":6384,"journal":{"name":"2012 IEEE 62nd Electronic Components and Technology Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2012-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 62nd Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2012.6248878","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

This study investigates the creep behavior of joint-scale Sn1.0Ag0.5Cu (SAC105) solder samples under shear loading. The objective of the work is to determine the Anand viscoplastic constitutive model parameters for this low silver content ternary SAC solder alloy. A series of monotonic constant shear stress (5-15MPa) and constant shear strain rate (1E-6-1E-2 (1/s)) tests was conducted at temperatures of 20°C, 50°C, 75°C and 100°C in order to provide data to extract the constitutive model parameters. The predictions of the Anand model are compared graphically with the experimental data in order to illustrate goodness-of-fit. SAC105 was found to be more creep resistant at higher strain rates than at lower strain rates for all temperatures and test conditions. The derived Anand parameters are shown to capture the creep performance of the SAC105 solder under shear loading very well, with the experimental data being tightly bound to the Anand predictions. In addition to the quantification of mechanical characteristics, a preliminary Electron Backscatter Diffraction (EBSD) investigation was conducted to investigate the effect of preconditioning on the grain structure of SAC105 solder joints. Results indicate that the misorientaion of the solder grains increased during preconditioning, signaling grain coarsening due to ageing.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
接头尺度Sn1.0Ag0.5Cu焊料剪切试样的蠕变行为
研究了接头尺度Sn1.0Ag0.5Cu (SAC105)焊料试样在剪切载荷作用下的蠕变行为。该工作的目的是确定这种低银含量三元SAC焊料合金的Anand粘塑性本构模型参数。在20°C、50°C、75°C和100°C的温度下,进行了一系列单调恒剪切应力(5-15MPa)和恒剪切应变速率(1E-6-1E-2 (1/s))试验,为提取本构模型参数提供数据。为了说明拟合优度,将Anand模型的预测结果与实验数据进行了图形化比较。在所有温度和测试条件下,SAC105在较高应变速率下比在较低应变速率下具有更强的抗蠕变性能。所得的Anand参数很好地反映了SAC105焊料在剪切载荷下的蠕变性能,实验数据与Anand预测结果紧密相关。除了对SAC105焊点的力学特性进行量化外,还进行了初步的电子背散射衍射(EBSD)研究,以研究预处理对SAC105焊点晶粒结构的影响。结果表明,预处理过程中钎料晶粒的取向偏差增大,表明钎料晶粒因时效而变粗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Parasitic electrical and electromagnetic effects Heat management Passive electronic components Interconnection technology Reliability and maintainability
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1