Angle-Resolved Photoemission Spectroscopy Utilizing Characteristics of Synchrotron Radiation

Hyomen Kagaku Pub Date : 2017-01-01 DOI:10.1380/JSSSJ.38.553
K. Horiba, Hiroshi Umigashira
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引用次数: 1

Abstract

Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental tool for revealing the electronic band structure of solids. Excellent characteristics of synchrotron radiation light enable us to achieve specialized ARPES measurements. In order to perform such experiments, we have constructed a new beamline BL-2 MUSASHI (Multiple Undulator beamline for Spectroscopic Analysis of Surface and Hetero-Interface) at Photon Factory, KEK. As examples of the specialized ARPES measurements by utilizing the advantage of this beamline, we introduce recent ARPES results on ( 1 ) three-dimensional electronic structures with changing the photon energy, ( 2 ) bulk electronic structures using high energy soft x rays, and ( 3 ) orbital-selective electronic structures by polarization dependent ARPES measurements.
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利用同步辐射特性的角分辨光谱学
角分辨光发射光谱(ARPES)是揭示固体电子能带结构的有力实验工具。同步辐射光的优异特性使我们能够实现专门的ARPES测量。为了进行这样的实验,我们在KEK光子工厂建立了一个新的光束线BL-2 MUSASHI(用于表面和异质界面光谱分析的多重波动光束线)。作为利用该光束线优势进行ARPES专业测量的例子,我们介绍了最近的ARPES结果:(1)改变光子能量的三维电子结构,(2)利用高能软x射线的体电子结构,(3)利用偏振相关ARPES测量的轨道选择性电子结构。
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