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Magnetism and Electronic Structure of the Fe 3 O 4 (111) Surface fe3o4(111)表面的磁性和电子结构
Pub Date : 2017-12-10 DOI: 10.1380/JSSSJ.38.608
K. Asakawa, T. Kawauchi, K. Fukutani
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引用次数: 0
Structural Change of TiO 2 (110) Surface Involved in the Photoinduced Wettability Transition tio2(110)表面结构变化参与光致润湿性转变
Pub Date : 2017-12-10 DOI: 10.1380/JSSSJ.38.620
T. Shirasawa, W. Voegeli, E. Arakawa, Chika Kamezawa, Toshio Takahashi, T. Matsushita
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引用次数: 0
Report on Joint Symposium of the Surface Science Society of Japan and the Vacuum Society of Japan (SSVS 2017) 日本表面科学学会与真空学会联合学术研讨会报告(SSVS 2017)
Pub Date : 2017-11-10 DOI: 10.1380/jsssj.38.584
K. Nakajima
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引用次数: 0
Report on the Fourth Kanto Chapter Seminar “On the frontiers of Scanning Probe Microscopy” 第四届关东分会“扫描探针显微镜前沿”研讨会报告
Pub Date : 2017-10-10 DOI: 10.1380/JSSSJ.38.530
K. Sagisaka, S. Ohno
2016年に発足した日本表面科学会関東支部では,表 面科学の研究分野で用いられる計測手法ごとに,最新の 研究テーマを議論する関東支部セミナーが企画されてい ます。本セミナーの特徴は,各分野の最先端研究をでき る限り専門外の参加者にも理解しやすく紹介することに 加え,基礎講座も合わせて開催することで,その分野の 初学者から専門家まで参加しやすく企画されていること です。 第 4回関東支部セミナー「走査型プローブ顕微鏡のフ ロンティア~実用材料表面計測入門から最新物性問題へ の挑戦まで~」は,昨年 10月 18日に東京大学にて開催 され,走査型プローブ顕微鏡(SPM)を使用して,こ の研究分野を先導されている 7人の先生方から,SPM の基礎講座と最新の研究トピックスについてご講演いた だきました。まず,東大の杉本宜昭先生から,走査型 トンネル顕微鏡(STM)と原子間力顕微鏡(AFM)の 歴史・原理・応用例を含む基礎的な内容をご講義いただ きました。東工大の中島健先生からは,AFMによる実 用高分子材料の力学特性評価法について,産総研の井藤 浩志先生からは,SPMの国際標準化の動向についてご 講演いただきました。続いて,東工大の一杉太郎先生か らは,ナノグラフェンと金属酸化膜の STM研究結果を 例に,STMによる実用材料研究への挑戦についてご講 演いただくとともに,これからの STM研究のあるべき 姿について問題提起をしていただきました。さらに,理 研の花栗哲郎先生からは,STMによる分光イメージン グを用いた超伝導体およびトポロジカル絶縁体研究につ いて,東大物性研の吉田靖雄先生からは,スピン偏極 STMによる表面磁性研究について,物材機構の川井茂 樹先生からは,AFMによる分子内部構造のイメージン グと化学反応の追跡についてご講演いただきました。総 勢 88名の参加者とともに,先生方の美しいデータを楽 しみながら,多くの活発な議論が交わされました。 加えて,講演の合間にはポスター発表会も開催され, 一般ポスター発表 23件と企業によるポスター展示 5件 がありました。一般ポスター発表の中から,前川達洋氏 (東工大),中島脩平氏(東大物性研),遠藤由大氏(東 大理)の 3名が優秀ポスター賞を受賞されました。 昨年は STMの誕生から 35周年,AFMの誕生から 30 周年を祝う年でもありました。このことを意識したわけ ではありませんでしたが,この時期に SPMを取り上げ たセミナーを開催することができたことは大変幸運でし た。SPMの発明が,表面科学の研究手法に大きな影響 をもたらしたことは誰もが認めるところです。さらに, 成熟期に入った今も,Nature誌や Science誌をはじめと する著名な雑誌に多くの STM・AFM論文が掲載されて います。それらの論文に見られる実験データの質はこれ まで以上に高く,議論はますます高度化していると感じ ます。この先,SPMを用いた研究がどのような新発見 と展開をもたらしてくれるのか,非常に楽しみです。 最後に,ご講演に快諾いただいた先生方,一般ポスタ ー発表,企業ポスター展示にご参加いただいた企業の皆 様など,関係各位にこの場を借りて深く御礼申し上げま す。 表面科学 Vol. 38, No. 10, p. 530, 2017
2016年成立的日本表面科学会关东支部正在策划关东支部研讨会,针对表面科学研究领域所使用的不同测量方法,对最新的研究主题进行讨论。本研讨会的特点是,尽可能将各领域的最尖端研究介绍给专业以外的参加者,同时举办基础讲座,从该领域的初出茅庐的学者到专家都能轻松参加。是。第4届关东支部研讨会“扫描型探针显微镜的研究~从实用材料表面计测入门到挑战最新物性问题”于去年10月18日在东京大学召开。使用扫描探针显微镜(SPM),邀请了在该研究领域处于领先地位的7位老师就SPM的基础讲座和最新的研究主题进行了演讲。首先,东京大学的杉本宜昭教授为我们讲解了包括扫描隧道显微镜(STM)和原子力显微镜(AFM)的历史、原理、应用实例在内的基本内容。东京工业大学的中岛健老师就AFM的实用高分子材料力学特性评价法进行了演讲,产综研的井藤浩志老师就SPM的国际标准化动向进行了演讲。接下来,东工大学的一杉太郎老师以纳米石墨烯和金属氧化膜的STM研究结果为例,介绍了STM对实用材料研究的挑战。关于姿态提出了问题。此外,理研的花栗哲郎教授将研究利用STM光谱成像工具的超导体及拓扑绝缘体研究,东大物性研的吉田靖雄教授将研究自旋极化关于STM的表面磁性研究,材料机构的川井茂树老师就AFM的分子内部结构成像和化学反应追踪进行了演讲。和总共88名的参加者一起,一边享受着老师们漂亮的数据,一边进行了很多活跃的讨论。另外,在演讲的间隙还举行了海报发表会,共有23个普通海报发表和5个企业海报展示。前川达洋(东京工业大学)、中岛脩平(东京大学物性研究所)、远藤由大(东大理)3人获得优秀海报奖。去年是STM诞生35周年,AFM诞生30周年。虽然当时并没有意识到这一点,但能够在这个时期召开SPM研讨会,实在是非常幸运。众所周知,SPM的发明对表面科学的研究方法产生了巨大的影响。而且,即使在进入成熟期的今天,包括Nature、Science在内的著名杂志上仍有很多STM、AFM论文。在那些论文中可以看到的实验数据的质量比以往都高,我感到讨论越来越高级。今后,基于SPM的研究将会有怎样的新发现和新进展,我们非常期待。最后,在此向欣然接受演讲的各位老师、参加普通海报发表和企业海报展示的企业的各位负责人表示深深的谢意。表面科学Vol. 38, No. 10, p. 530,2017
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引用次数: 0
International Activity in SSSJ-Kansai : ISSS-7 and SSSN-Kansai 关西地区的国际活动:issn -7和ssn -关西
Pub Date : 2017-10-10 DOI: 10.1380/jsssj.38.531
Takuya Matsumoto
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引用次数: 0
佐川眞人博士特別講演会 「ネオジム磁石—過去,現在,未来」 佐川真人博士特别讲演会 「ネオジム磁石—过去,现在,未来」
Pub Date : 2017-09-10 DOI: 10.1380/jsssj.38.483
俊郎 荻野
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引用次数: 0
Fabrication and UHV-STM Observation of Melamine-Aldehyde Nanostructures from Solutions on Au 金溶液中三聚氰胺醛纳米结构的制备及UHV-STM观察
Pub Date : 2017-08-10 DOI: 10.1380/JSSSJ.38.384
A. Okada, Urara Toyota, Kosuke Minou, M. Yoshimura, K. Kadono
In the present study, surface organic nanostructures consisting of melamine and terephthalaldehyde were prepared by solution method, i. e. solvent evaporations of the aqueous solutions. The prepared samples were observed using scanning tunneling microscopy (STM) in ultrahigh vacuum (UHV). In UHV observation, no oligomers as reaction products were imaged. Instead, unknown beltlike molecular rows and disordered phase appeared. In the case of coexisted area of the unknown and disordered phases, tip-induced phase transition was observed. The beltlike rows were attributed to the arrangement of terephthalaldehyde molecules. Based on the high-resolution observation, the tentative model of the TPA arrangement was proposed. The elongated keeping of the sample in UHV to progress the oligomer formation did not lead to formation of oligomers. From the present experimental results, we consider that the stability of the reaction products in UHV is low and such reactant molecules were probably included in the mobile disordered phases. GNR )
本研究采用溶液法,即溶剂蒸发法制备了三聚氰胺和对苯二醛的表面有机纳米结构。用扫描隧道显微镜(STM)在超高真空(UHV)下观察制备的样品。在特高压观察中,没有低聚物作为反应产物成像。相反,出现了未知的带状分子行和无序相。在未知相和无序相共存的情况下,观察到尖端诱导相变。这种带状排列归因于对苯二甲酸二醛分子的排列。基于高分辨率观测,提出了TPA安排的初步模型。在超高压条件下延长样品的保存时间以促进低聚物的形成并没有导致低聚物的形成。从目前的实验结果来看,我们认为反应产物在特高压下的稳定性较低,这些反应物分子可能包含在流动无序相中。GNR)
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引用次数: 1
Water-Adsorbed Ultrathin GeO 2 /Ge and SiO 2 /Si Structure Studied In Situ by Near-Ambient-Pressure X-ray Photoelectron Spectroscopy 近大气压x射线光电子能谱原位研究水吸附超薄GeO 2 /Ge和sio2 /Si结构
Pub Date : 2017-07-10 DOI: 10.1380/JSSSJ.38.330
Kenta Arima
We carried out near-ambient-pressure X-ray photoelectron spectroscopy (NAP-XPS) measurements of water-adsorbed ultrathin GeO 2 films on Ge substrates, and the results were compared with those for SiO 2 films on Si. We obtained NAP-XPS spectra at relative humidity (RH) values of up to 〜 15 % and showed that the GeO 2 / Ge structures attract more water molecules than the SiO 2 / Si structures at RH above 〜 10 − 4 % . This is probably because water molecules infiltrate the GeO 2 films to form hydroxyls. Then we revealed positive charging of the water-adsorbed SiO 2 films by their interaction with X-rays. For the water-adsorbed GeO 2 films, we observed greater positive charging of the films, of which origin is discussed.
利用近大气压x射线光电子能谱(NAP-XPS)对Ge衬底上的水吸附超薄GeO 2薄膜进行了测量,并与Si衬底上的sio2薄膜进行了比较。我们在相对湿度(RH)高达~ 15%时获得了NAP-XPS光谱,结果表明,在相对湿度(RH)高于~ 10−4%时,GeO 2 / Ge结构比sio2 / Si结构吸引更多的水分子。这可能是因为水分子渗透到geo2薄膜中形成羟基。然后我们通过与x射线的相互作用揭示了水吸附二氧化硅薄膜的正电荷。对于水吸附的geo2膜,我们观察到膜的正电荷较大,并讨论了其来源。
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引用次数: 0
Direct Observation of the Energy Distribution of Interface States at SiO 2 /4H-SiC Interface: Operando Hard X-ray Photoelectron Spectroscopic Study 二氧化硅/4H-SiC界面态能量分布的直接观察:硬x射线光电子能谱研究
Pub Date : 2017-07-10 DOI: 10.1380/jsssj.38.347
Y. Yamashita, R. Hasunuma, T. Nagata, T. Chikyow
The energy distribution of the interface states at the SiO 2 / 4H-SiC(0001) interface was obtained using operando hard x-ray photoelectron spectroscopy. For the energy distribution, two components exsisted. The sharp and high density interface states were observed near the conduction band minimum (CBM) while uniform interface states were present in the entire SiC band-gap. The uniform interface states in the whole gap were assigned to graphitic carbon clusters at the interface while the sharp interface states near CBM could not be clarified in the present study.
利用硬x射线光电子能谱分析了sio2 / 4H-SiC(0001)界面态的能量分布。对于能量分布,存在两个分量。在导带最小值(CBM)附近观察到尖锐和高密度的界面态,而在整个SiC带隙中存在均匀的界面态。整个间隙内均匀的界面态归属于界面处的石墨碳团簇,而煤层气附近的尖锐界面态在本研究中尚不能明确。
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引用次数: 0
Report on Public Lecture in Kyushu Branch, 2016 “Changing Properties by Surface” 2016年九州分会公开讲座报告“表面改变属性”
Pub Date : 2017-07-10 DOI: 10.1380/jsssj.38.367
Shuichi Nagamatsu
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引用次数: 0
期刊
Hyomen Kagaku
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