{"title":"Predicting the Life Time of Power Semiconductor Modules","authors":"Clovis N. L. Gajo, Arendt Wintrich, Paul Drexhage","doi":"10.1109/COBEP/SPEC44138.2019.9065764","DOIUrl":null,"url":null,"abstract":"Methods to estimate the lifetime of Power Semiconductor Modules, the typical aging factors, how they act, and some of the new improvement technologies that lead to higher lifetime.","PeriodicalId":69617,"journal":{"name":"电力电子","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"电力电子","FirstCategoryId":"1093","ListUrlMain":"https://doi.org/10.1109/COBEP/SPEC44138.2019.9065764","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Methods to estimate the lifetime of Power Semiconductor Modules, the typical aging factors, how they act, and some of the new improvement technologies that lead to higher lifetime.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
