The Estimation and Improvement of TTL Alignment Error Budgets for an Excimer Laser Aligner.

T. Higashiki, T. Tojo, M. Tabata, T. Nishizaka, H. Yoshino, S. Saito
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Abstract

This paper describes studies on the alignment error budgets caused by a TTL (through the lens) alignment optical system (SMART : separated mark TTL alignment) for an excimer laser aligner. Alignment error factors, such as the optical phase fluctuation of the alignment beam, the inclination variation of the alignment incident beam, the tilt of the wafer and the reticle, and the defocus of the reticle, have been analyzed and estimated. It was demonstrated that the total error of the alignment optical system was required to be better than 0.02 μm in order to satisfy the positioning strategy of the excimer laser aligner with a 0.05 μm (3σ) overlay accuracy. Several compensation methods have been developed and adopted to SMART. As a result, it was obtained experimentally that the total error of the alignment optical system became better than 0.02 μm. It has met the development goal. The new SMART optical system which was adopted to the KrF excimer laser aligner showed an excellent performance with a better than 0.05 μm (3σ) overlay accuracy.
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准分子激光对准仪TTL对准误差估计及改进。
本文研究了准分子激光准直仪的TTL(通过透镜)准直光学系统(SMART:分离标记TTL准直)的准直误差预算。分析和估计了准直光束的光学相位波动、准直入射光束的倾角变化、晶片和准星的倾斜以及准星的离焦等准直误差因素。结果表明,准分子激光准直仪的覆盖精度为0.05 μm (3σ),为了满足准分子激光准直仪的定位要求,准分子准直光学系统的总误差必须小于0.02 μm。SMART已经开发并采用了几种补偿方法。实验结果表明,准直光学系统的总误差优于0.02 μm。实现了发展目标。应用于KrF准分子激光准直仪的SMART光学系统性能优异,覆盖精度优于0.05 μm (3σ)。
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