Shugo Yoshida, Takahiro Nagase, K. Iwama, Hiroaki Miyake, Yasuhiro Tanaka
{"title":"電子線照射フッ素系絶縁材料中の電子正孔対生成量の解析;電子線照射フッ素系絶縁材料中の電子正孔対生成量の解析;Analysis for Amount of Electron Hole Pair in Electron Beam Irradiated Floride Polymers","authors":"Shugo Yoshida, Takahiro Nagase, K. Iwama, Hiroaki Miyake, Yasuhiro Tanaka","doi":"10.1541/IEEJFMS.137.632","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":23081,"journal":{"name":"The transactions of the Institute of Electrical Engineers of Japan.A","volume":"18 1","pages":"632-638"},"PeriodicalIF":0.0000,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The transactions of the Institute of Electrical Engineers of Japan.A","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1541/IEEJFMS.137.632","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}