{"title":"Two Wavelet-based Algorithms for Chemical Recognition Using Transmission Terahertz Spectral Imaging Through Turbid Media","authors":"Mahmoud E. Khani, M. Arbab","doi":"10.1109/IRMMW-THz46771.2020.9370625","DOIUrl":null,"url":null,"abstract":"Dielectric heterogeneity in addition to wavelength-scale air voids and granular particles lead to significant electromagnetic scattering in the transmission-mode THz-TDS. These scattering processes result in the distorted or obscured resonant signatures, a frequency-dependent extinction loss, and the appearance of anomalous spectral artifacts, imposing severe challenges on the real-world automatic material characterization schemes. In this work, we use a combination of the wavelet multiresolution analysis, the principal component analysis, and the bimodality coefficient to simultaneously identify all the resonant frequencies of a heterogeneous sample embedded beneath a highly scattering turbid medium.","PeriodicalId":6746,"journal":{"name":"2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)","volume":"55 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THz46771.2020.9370625","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Dielectric heterogeneity in addition to wavelength-scale air voids and granular particles lead to significant electromagnetic scattering in the transmission-mode THz-TDS. These scattering processes result in the distorted or obscured resonant signatures, a frequency-dependent extinction loss, and the appearance of anomalous spectral artifacts, imposing severe challenges on the real-world automatic material characterization schemes. In this work, we use a combination of the wavelet multiresolution analysis, the principal component analysis, and the bimodality coefficient to simultaneously identify all the resonant frequencies of a heterogeneous sample embedded beneath a highly scattering turbid medium.