A time-dependent SPICE model for single electron box and its application to logic gates at low and high temperatures

Abstract

Possibility of modeling and simulation of single electron devices, such as Single electron box (SEB), in a circuit simulator such as SPICE is a key step to designing integrated circuits based on single electron devices, because it makes possible analyzing of a combination of SEB and other circuit elements in a single platform. Some efforts have been done to this end in the past and some models introduced [1,2,3] but all of the models were restricted to low frequency and low temperature range. In this paper, we propose a circuit model for SEB that can operate in high temperature and also in the intrinsic frequency range of these devices. This model can be used for an estimation of the bit error rate in logic applications of these devices as well.