G. Poelman, S. Hedayatrasa, W. Van Paepegem, M. Kersemans
{"title":"On the Defect Detection Limits of Flash Thermography in Reflection Mode: a Comprehensive Parametric 3D FE Study","authors":"G. Poelman, S. Hedayatrasa, W. Van Paepegem, M. Kersemans","doi":"10.1016/j.infrared.2023.104560","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13606,"journal":{"name":"Infrared Physics & Technology","volume":"75 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared Physics & Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/j.infrared.2023.104560","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}