Limits on voltage scaling for caches utilizing fault tolerant techniques

Avesta Sasan, A. Djahromi, A. Eltawil, F. Kurdahi
{"title":"Limits on voltage scaling for caches utilizing fault tolerant techniques","authors":"Avesta Sasan, A. Djahromi, A. Eltawil, F. Kurdahi","doi":"10.1109/ICCD.2007.4601943","DOIUrl":null,"url":null,"abstract":"This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.","PeriodicalId":6306,"journal":{"name":"2007 25th International Conference on Computer Design","volume":"92 1","pages":"488-495"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 25th International Conference on Computer Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2007.4601943","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25

Abstract

This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
使用容错技术的缓存电压缩放限制
本文提出了一种新的低功耗缓存架构,该架构利用容错能力来大幅降低电压水平。容错架空电路耗能小,但能使系统正常运行,提高系统性能,接近无缺陷运行。总体而言,在标准基准测试中报告的节电超过40%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Compiler-assisted architectural support for program code integrity monitoring in application-specific instruction set processors Improving the reliability of on-chip data caches under process variations Analytical thermal placement for VLSI lifetime improvement and minimum performance variation Why we need statistical static timing analysis Voltage drop reduction for on-chip power delivery considering leakage current variations
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1