{"title":"A broadband free-space dielectric measurement system","authors":"N. Zhang, Junjie Cheng, Peng-wei Gong, Hongmei Ma","doi":"10.1109/IMWS-AMP.2015.7324930","DOIUrl":null,"url":null,"abstract":"There are two X-band ripples horn single-lens antennas, waveguide transmission segment, fixture, a mounting station, an Agilent N5225A network analyzer and a computer in the free-space measurement system of 8GHz~40GHz frequency range. S11 and S21 of sample measured by network analyzer are used to calculate the dielectric constant. A dual calibration technique of SOLT and GRL is used to eliminate errors due to multiple reflections via the surface of the sample. How the X-band free-space measurement system works at 12.4GHz~40GHz frequency range is introduced and measurement results are reported for some absorbing material.","PeriodicalId":6625,"journal":{"name":"2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"6 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMWS-AMP.2015.7324930","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
There are two X-band ripples horn single-lens antennas, waveguide transmission segment, fixture, a mounting station, an Agilent N5225A network analyzer and a computer in the free-space measurement system of 8GHz~40GHz frequency range. S11 and S21 of sample measured by network analyzer are used to calculate the dielectric constant. A dual calibration technique of SOLT and GRL is used to eliminate errors due to multiple reflections via the surface of the sample. How the X-band free-space measurement system works at 12.4GHz~40GHz frequency range is introduced and measurement results are reported for some absorbing material.
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